Construction and characterization of a heating stage for a scanning probe microscope up to 215°C

Review of Scientific Instruments

Volumn 71, Issue 5, 2000, Pages 2100-2103

  Xie, Z ^a,b   Luo, E Z ^a   Xu, J B ^a   Wilson, I H ^a   Zhao, L H ^b   Zhang, X X ^c  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^b HUNAN UNIVERSITY   (China)

^c HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001713437     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150587     Document Type: Article

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