Polarization-dependent vacuum-ultraviolet reflectometry using elliptically polarized synchrotron radiation

Applied Optics

Volumn 46, Issue 32, 2007, Pages 7797-7804

  Gottwald, Alexander ^a   Bridou, Françoise ^b   Cuniot Ponsard, Mireille ^b   Desvignes, Jean Michel ^b   Kroth, Simone ^a   Kroth, Udo ^a   Paustian, Wolfgang ^a   Richter, Mathias ^a   Schöppe, Hendrik ^a   Thornagel, Reiner ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^b UNIV PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT REFLECTION; PHOTODETECTORS; STORAGE RINGS; SYNCHROTRON RADIATION; ULTRAVIOLET RADIATION; UNCERTAINTY ANALYSIS;

PHYSIKALISCH-TECHNISCHE BUNDESANSTALT (PTB); POLARIZED SYNCHROTRON RADIATION; POLARIZING MIRRORS; ULTRAVIOLET REFLECTOMETRY;

LIGHT POLARIZATION;

EID: 38849086615     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.007797     Document Type: Article

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