Tunable thin film polarizer for the vacuum ultraviolet and soft x-ray spectral regions

Journal of Applied Physics

Volumn 101, Issue 5, 2007, Pages

  Yang, Minghong ^a   Cobet, Christoph ^a   Esser, Norbert ^a  

^a ISAS INSTITUTE FOR ANALYTICAL SCIENCES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; OPTIMIZATION; SPECTRUM ANALYSIS; ULTRAVIOLET RADIATION; VACUUM APPLICATIONS;

LOW PASS POLARIZERS; PHOTON ENERGY; THIN FILM POLARIZERS; X RAY POLARIZERS;

THIN FILM DEVICES;

EID: 33947325814     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2710354     Document Type: Article

References (22)

1. G. Reichardt, T. Noll, I. Packe, P. Rotter, J. S. Schmidt, and W. Gudat, Nucl. Instrum. Methods Phys. Res. A 467-468, 462 (2001).
2. J. Bahrdt, G. Reichardt, T. Noll, W. Gudat, G. Ingold, and S. Sasaki, Nucl. Instrum. Methods Phys. Res. A 467-468, 589 (2001).
3. J. A. Dobrowoski and A. Walddorf, Appl. Opt. 20, 111 (1981).
4. V. G. Horton, E. T. Arakawa, R. N. Hamm, and M. W. Williams, Appl. Opt. 8, 667 (1969).
5. T. Imazono, T. Hirono, Y. Saitoh, and K. Sano, Rev. Sci. Instrum. 76, 126106 (2005).
6. T. Imazono, H. Kimura, and K. Sano, Rev. Sci. Instrum. 76, 023104 (2005).
7. H. Höchst, P. Bulicke, T. Nelson, and F. Middleton, Rev. Sci. Instrum. 66, 1598 (1995).
8. H. Höchst, D. Rioux, D. Zhao, and D. Huber, Phys. Rev. B. 65, 064439 (2002).
9. I. Baek, S. Hulbert, and E. Vescovo, Rev. Sci. Instrum. 73, 1491 (2002).
10. S. Naik and G. S. Lodha, Nucl. Instrum. Methods Phys. Res. A 560, 211 (2006).
11. P. Finetti, D. M. P. Holland, C. J. Latimer, and C. Binns, Nucl. Instrum. Methods Phys. Res. B 215, 565 (2004).
12. F. Schäfers, Appl. Opt. 38, 4074 (1999).
13. M. Yanagihara, T. Maehara, H. Nomura, M. Yamamoto, and T. Namioka, Rev. Sci. Instrum. 63, 1516 (1992).
14. J. B. Kortright, M. Rice, and K. D. Franck, Rev. Sci. Instrum. 66, 1567 (1995).
15. Z. S. Wang, H. C. Wang, J. T. Zhu, F. L. Wang, Z. X. Gu, and L. Y. Chen, J. Appl. Phys. 99, 056108 (2006).
16. C. Montcalm, P. A. Kearney, J. M. Slaughter, B. T. Sullivan, M. Chaker, and C. M. Falco, Appl. Opt. 35, 5134 (1996).
17. W. R. Hunter, Appl. Opt. 17, 1259 (1978).
18. T. Maehara, H. Kimura, H. Nomura, M. Yanagihara, and T. Namioka, Appl. Opt. 30, 5018 (1991).
19. L. J. Terminello, A. B. McLean, A. Santoni, E. Spiller, and F. J. Himpsel, Rev. Sci. Instrum. 61, 1626 (1990).
20. J. H. Underwood and E. M. Gullikson, J. Electron Spectrosc. Relat. Phenom. 92, 265 (1998).
21. T. Wethkamp, K. Wilmers, C. Cobet, N. Esser, W. Richter, O. Ambacher, M. Stutzmann, and M. Candona, Phys. Rev. B 59, 1845 (1999).
22. C. Cobet, Phys. Rev. B 64, 165203 (2001).