Experimental determination of optical constants in the vacuum ultra violet wavelength region between 80 and 140 nm: A reflectance versus thickness method and its application to ZnSe

Optics Communications

Volumn 271, Issue 2, 2007, Pages 353-360

  Bridou, Françoise ^a   Cuniot Ponsard, Mireille ^a   Desvignes, Jean Michel ^a  

^a INSTITUT D'OPTIQUE GRADUATE SCHOOL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; ELECTRONIC STRUCTURE; LIGHT REFLECTION; MIRRORS; OPTICAL PROPERTIES; ZINC COMPOUNDS;

ELECTRONIC BAND STRUCTURE; OPTICAL CONSTANTS; OPTICAL MEASUREMENTS;

ULTRAVIOLET RADIATION;

EID: 33846230580     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2006.10.042     Document Type: Article

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