Soft-x-ray polarimeter with multilayer optics: Complete analysis of the polarization state of light

Applied Optics

Volumn 38, Issue 19, 1999, Pages 4074-4088

  Schäfers, Franz ^a   Mertins, Hans Christoph ^a   Gaupp, Andreas ^a   Gudat, Wolfgang ^a   Mertin, Marcel ^a   Packe, Ingo ^a   Schmolla, Frank ^a   Di Fonzo, Silvia ^b   Soullie, Gérard ^b   Jark, Werner ^b   Walker, Richard ^b   Le Cann, Xavier ^c   Nyholm, Ralf ^c   Eriksson, Mikael ^c  

^a SAITAMA UNIVERSITY   (Japan)

^b SINCROTRONE TRIESTE   (Italy)

^c MAX IV LABORATORY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 18044401838     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.004074     Document Type: Article

References (53)

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