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Volumn 129, Issue 3, 2007, Pages 273-277

Effect of voids on thermomechanical durability of Pb-free BGA solder joints: Modeling and simulation

Author keywords

Durability; FEA; Lead free; Thermomechanical; Voids

Indexed keywords

COMPUTER SIMULATION; DURABILITY; ELECTRONIC EQUIPMENT; FINITE ELEMENT METHOD; RELIABILITY; TIN ALLOYS;

EID: 38749129114     PISSN: 10437398     EISSN: 15289044     Source Type: Journal    
DOI: 10.1115/1.2753911     Document Type: Article
Times cited : (34)

References (16)
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  • 2
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    • Sharma, P.1    Dasgupta, A.2
  • 4
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    • Investigation of Void Formation and Shear Strength of Sn42Bi58 Solder Joints for Low Cost Application
    • New Orleans, May, pp
    • Herzog, Th., Wolter, K. J., and Poetsch, F., 2003, "Investigation of Void Formation and Shear Strength of Sn42Bi58 Solder Joints for Low Cost Application," Proceedings of the 53rd Electronic Components and Technology Conference, New Orleans, May, pp. 1738-1745.
    • (2003) Proceedings of the 53rd Electronic Components and Technology Conference , pp. 1738-1745
    • Herzog, T.1    Wolter, K.J.2    Poetsch, F.3
  • 5
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    • Effects of Voids and Their Interactions on SMT Solder Joint Reliability
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    • Effect of Voids on the Reliability of BGA/CSP Solder Joints
    • Yunus, M., Primavera, A., and Srihari, K., 2003, "Effect of Voids on the Reliability of BGA/CSP Solder Joints," Microelectron. Reliab., 43(12), pp. 2077-2086.
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  • 13
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  • 15
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    • Zhang, Q.1    Dasgupta, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.