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Volumn 129, Issue 4, 2007, Pages 496-503

Isothermal cyclic bend fatigue test method for lead-free solder joints

Author keywords

Cyclic bend test; Fatigue model; Lead free solder; Sn Ag Cu

Indexed keywords

CYCLIC LOADS; HIGH TEMPERATURE EFFECTS; MATHEMATICAL MODELS; SOLDERED JOINTS; STRAIN MEASUREMENT; STRESS ANALYSIS; TIN ALLOYS;

EID: 38749103133     PISSN: 10437398     EISSN: 15289044     Source Type: Journal    
DOI: 10.1115/1.2809442     Document Type: Article
Times cited : (13)

References (13)
  • 1
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    • Reliability Investigations of Leadless QFN Packages Until End-of-Life With Application-Specific Board-Level Stress Tests
    • San Diego, May 30-Jun. 2, pp
    • Birzer, C., Stoeckl, S., Schuetz, G., and Fink, M., 2006, "Reliability Investigations of Leadless QFN Packages Until End-of-Life With Application-Specific Board-Level Stress Tests," Proceedings of the 56th Electronic Components and Technology Conference, San Diego, May 30-Jun. 2, pp. 594-600.
    • (2006) Proceedings of the 56th Electronic Components and Technology Conference , pp. 594-600
    • Birzer, C.1    Stoeckl, S.2    Schuetz, G.3    Fink, M.4
  • 3
    • 0347567450 scopus 로고    scopus 로고
    • Three- and Four-Point Bend Testing for Electronic Packages
    • Shetty, S., and Reinikainen, T., 2003, "Three- and Four-Point Bend Testing for Electronic Packages," ASME J. Electron. Packag. 125(4), pp. 556-561.
    • (2003) ASME J. Electron. Packag , vol.125 , Issue.4 , pp. 556-561
    • Shetty, S.1    Reinikainen, T.2
  • 6
    • 85199302696 scopus 로고    scopus 로고
    • JEDEC Standard, 2004, IPC/JEDEC-9702: Monotonic Bend Characterization of Board-Level Interconnects.
    • JEDEC Standard, 2004, IPC/JEDEC-9702: Monotonic Bend Characterization of Board-Level Interconnects.
  • 7
    • 0032181830 scopus 로고    scopus 로고
    • Reliability Comparison of Different Surface Finishes on Copper
    • Yee, S., and Ladhar, H., 1998, "Reliability Comparison of Different Surface Finishes on Copper," Circuit World 25(1), pp. 25-29.
    • (1998) Circuit World , vol.25 , Issue.1 , pp. 25-29
    • Yee, S.1    Ladhar, H.2
  • 8
    • 0030141874 scopus 로고    scopus 로고
    • Effect of PCB Finish on the Reliability and Wettability of Ball Grid Array Packages
    • Bradley, E., and Banerji, K., 1996, "Effect of PCB Finish on the Reliability and Wettability of Ball Grid Array Packages," IEEE Trans. Compon., Packag. Manuf. Technol., Part B 19(2), pp. 320-330.
    • (1996) IEEE Trans. Compon., Packag. Manuf. Technol., Part B , vol.19 , Issue.2 , pp. 320-330
    • Bradley, E.1    Banerji, K.2
  • 9
    • 85199298101 scopus 로고    scopus 로고
    • Che, F. X., Pang, H. L. J., Zhu, W. H., Sun, W., and Sun, Y. S. A., 2006, Modeling Constitutive Model Effect on Reliability of Lead-Free Solder Joints, Proceedings of the International Conference of Electronics Packaging Technology (ICEPT2006), Shanghai, China, Aug. 26-29, pp. 155-160.
    • Che, F. X., Pang, H. L. J., Zhu, W. H., Sun, W., and Sun, Y. S. A., 2006, "Modeling Constitutive Model Effect on Reliability of Lead-Free Solder Joints," Proceedings of the International Conference of Electronics Packaging Technology (ICEPT2006), Shanghai, China, Aug. 26-29, pp. 155-160.
  • 10
    • 24644483221 scopus 로고    scopus 로고
    • Thermal Fatigue Reliability Analysis for PBGA With Sn-3.8Ag-0.7Cu Solder Joints
    • Singapore, Dec. 8-10, pp
    • Che, F. X., and Pang, H. L. J., 2004, "Thermal Fatigue Reliability Analysis for PBGA With Sn-3.8Ag-0.7Cu Solder Joints," Proceedings of the 6th Electronics Packaging Technology Conference, Singapore, Dec. 8-10, pp. 787-792.
    • (2004) Proceedings of the 6th Electronics Packaging Technology Conference , pp. 787-792
    • Che, F.X.1    Pang, H.L.J.2
  • 13
    • 0034820413 scopus 로고    scopus 로고
    • Mechanical Bending Fatigue Reliability and Its Application to Area Array Packaging
    • Orlando, May 29-June 1, pp
    • Skipor, A., and Leicht, L., 2001, "Mechanical Bending Fatigue Reliability and Its Application to Area Array Packaging," Proceedings of the 51st Electronic Components and Technology Conference, Orlando, May 29-June 1, pp. 606-612.
    • (2001) Proceedings of the 51st Electronic Components and Technology Conference , pp. 606-612
    • Skipor, A.1    Leicht, L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.