-
1
-
-
33845581695
-
Reliability Investigations of Leadless QFN Packages Until End-of-Life With Application-Specific Board-Level Stress Tests
-
San Diego, May 30-Jun. 2, pp
-
Birzer, C., Stoeckl, S., Schuetz, G., and Fink, M., 2006, "Reliability Investigations of Leadless QFN Packages Until End-of-Life With Application-Specific Board-Level Stress Tests," Proceedings of the 56th Electronic Components and Technology Conference, San Diego, May 30-Jun. 2, pp. 594-600.
-
(2006)
Proceedings of the 56th Electronic Components and Technology Conference
, pp. 594-600
-
-
Birzer, C.1
Stoeckl, S.2
Schuetz, G.3
Fink, M.4
-
2
-
-
0038970549
-
Fatigue of Chip Scale Package Interconnects Due to Cyclic Bending
-
Shetty, S., Lehtinen, V., Dasgupta, A., Halkola, V., and Reinikainen, T., 2001, "Fatigue of Chip Scale Package Interconnects Due to Cyclic Bending," ASME J. Electron. Packag. 123(3), pp. 302-308.
-
(2001)
ASME J. Electron. Packag
, vol.123
, Issue.3
, pp. 302-308
-
-
Shetty, S.1
Lehtinen, V.2
Dasgupta, A.3
Halkola, V.4
Reinikainen, T.5
-
3
-
-
0347567450
-
Three- and Four-Point Bend Testing for Electronic Packages
-
Shetty, S., and Reinikainen, T., 2003, "Three- and Four-Point Bend Testing for Electronic Packages," ASME J. Electron. Packag. 125(4), pp. 556-561.
-
(2003)
ASME J. Electron. Packag
, vol.125
, Issue.4
, pp. 556-561
-
-
Shetty, S.1
Reinikainen, T.2
-
4
-
-
10444245851
-
Use-Condition-Based Cyclic Bend Test Development for Handheld Components
-
Las Vegas, June 1-4, pp
-
Mercado, L. L., Philips, B., Sahasrabudhe, S., Sedillo, J. P., Bray, D., and Monroe, E., 2004, "Use-Condition-Based Cyclic Bend Test Development for Handheld Components," Proceedings of the 54th Electronic Components and Technology Conference, Las Vegas, June 1-4, pp. 1279-1287.
-
(2004)
Proceedings of the 54th Electronic Components and Technology Conference
, pp. 1279-1287
-
-
Mercado, L.L.1
Philips, B.2
Sahasrabudhe, S.3
Sedillo, J.P.4
Bray, D.5
Monroe, E.6
-
5
-
-
0036292713
-
Effect of Strain Rate on Solder Joint Failure under Mechanical Load
-
San Diego, May 28-31, pp
-
Geng, P., Chen, P., and Ling, Y., 2002, "Effect of Strain Rate on Solder Joint Failure under Mechanical Load," Proceedings of the 52nd Electronic Components and Technology Conference, San Diego, May 28-31, pp. 974-978.
-
(2002)
Proceedings of the 52nd Electronic Components and Technology Conference
, pp. 974-978
-
-
Geng, P.1
Chen, P.2
Ling, Y.3
-
6
-
-
85199302696
-
-
JEDEC Standard, 2004, IPC/JEDEC-9702: Monotonic Bend Characterization of Board-Level Interconnects.
-
JEDEC Standard, 2004, IPC/JEDEC-9702: Monotonic Bend Characterization of Board-Level Interconnects.
-
-
-
-
7
-
-
0032181830
-
Reliability Comparison of Different Surface Finishes on Copper
-
Yee, S., and Ladhar, H., 1998, "Reliability Comparison of Different Surface Finishes on Copper," Circuit World 25(1), pp. 25-29.
-
(1998)
Circuit World
, vol.25
, Issue.1
, pp. 25-29
-
-
Yee, S.1
Ladhar, H.2
-
8
-
-
0030141874
-
Effect of PCB Finish on the Reliability and Wettability of Ball Grid Array Packages
-
Bradley, E., and Banerji, K., 1996, "Effect of PCB Finish on the Reliability and Wettability of Ball Grid Array Packages," IEEE Trans. Compon., Packag. Manuf. Technol., Part B 19(2), pp. 320-330.
-
(1996)
IEEE Trans. Compon., Packag. Manuf. Technol., Part B
, vol.19
, Issue.2
, pp. 320-330
-
-
Bradley, E.1
Banerji, K.2
-
9
-
-
85199298101
-
-
Che, F. X., Pang, H. L. J., Zhu, W. H., Sun, W., and Sun, Y. S. A., 2006, Modeling Constitutive Model Effect on Reliability of Lead-Free Solder Joints, Proceedings of the International Conference of Electronics Packaging Technology (ICEPT2006), Shanghai, China, Aug. 26-29, pp. 155-160.
-
Che, F. X., Pang, H. L. J., Zhu, W. H., Sun, W., and Sun, Y. S. A., 2006, "Modeling Constitutive Model Effect on Reliability of Lead-Free Solder Joints," Proceedings of the International Conference of Electronics Packaging Technology (ICEPT2006), Shanghai, China, Aug. 26-29, pp. 155-160.
-
-
-
-
10
-
-
24644483221
-
Thermal Fatigue Reliability Analysis for PBGA With Sn-3.8Ag-0.7Cu Solder Joints
-
Singapore, Dec. 8-10, pp
-
Che, F. X., and Pang, H. L. J., 2004, "Thermal Fatigue Reliability Analysis for PBGA With Sn-3.8Ag-0.7Cu Solder Joints," Proceedings of the 6th Electronics Packaging Technology Conference, Singapore, Dec. 8-10, pp. 787-792.
-
(2004)
Proceedings of the 6th Electronics Packaging Technology Conference
, pp. 787-792
-
-
Che, F.X.1
Pang, H.L.J.2
-
11
-
-
24644487869
-
Lead Free Solder Joint Reliability Characterization for PBGA, PQFP and TSSOP Assemblies
-
Lake Byeng Visla, FL. FL, May 31-Jun. 3, pp
-
Che, F. X., Pang, H. L. J., Xiong, B. C., Xu, L. H., and Low, T. H., 2005, "Lead Free Solder Joint Reliability Characterization for PBGA, PQFP and TSSOP Assemblies," Proceedings of the 55th Electronic Components and Technology Conference, Lake Byeng Visla, FL. FL, May 31-Jun. 3, pp. 916-921.
-
(2005)
Proceedings of the 55th Electronic Components and Technology Conference
, pp. 916-921
-
-
Che, F.X.1
Pang, H.L.J.2
Xiong, B.C.3
Xu, L.H.4
Low, T.H.5
-
12
-
-
33845567770
-
Modeling Board-Level Four-Point Bend Fatigue and Impact Drop Tests
-
San Diego, May 30-Jun. 2, pp
-
Che, F. X., and Pang, H. L. J., "Modeling Board-Level Four-Point Bend Fatigue and Impact Drop Tests," Proceedings of the 56th Electronic Components and Technology Conference, San Diego, May 30-Jun. 2, pp. 443-448.
-
Proceedings of the 56th Electronic Components and Technology Conference
, pp. 443-448
-
-
Che, F.X.1
Pang, H.L.J.2
-
13
-
-
0034820413
-
Mechanical Bending Fatigue Reliability and Its Application to Area Array Packaging
-
Orlando, May 29-June 1, pp
-
Skipor, A., and Leicht, L., 2001, "Mechanical Bending Fatigue Reliability and Its Application to Area Array Packaging," Proceedings of the 51st Electronic Components and Technology Conference, Orlando, May 29-June 1, pp. 606-612.
-
(2001)
Proceedings of the 51st Electronic Components and Technology Conference
, pp. 606-612
-
-
Skipor, A.1
Leicht, L.2
|