메뉴 건너뛰기




Volumn 1, Issue , 2005, Pages 916-921

Lead free solder joint reliability characterization for PBGA, PQFP and TSSOP assemblies

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC ASSEMBLIES; FAILURE MODES; SURFACE FINISHING;

EID: 24644487869     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (37)

References (14)
  • 1
    • 0038162826 scopus 로고    scopus 로고
    • JEDEC Standard, JESD22-A104B, July
    • JEDEC Standard, JESD22-A104B, Temperature Cycling, July 2000.
    • (2000) Temperature Cycling
  • 2
    • 0034479828 scopus 로고    scopus 로고
    • Effect of simulation methodology on solder joint crack growth correlation
    • May 21-24, Las Vegas, Nevada
    • Darveaux, R., "Effect of Simulation Methodology on Solder Joint Crack Growth Correlation", 50th ECTC, May 21-24, 2000, Las Vegas, Nevada, pp. 1048-1058.
    • (2000) 50th ECTC , pp. 1048-1058
    • Darveaux, R.1
  • 3
    • 10444263028 scopus 로고    scopus 로고
    • Accelerated thermal cycling: Is it different for lead-free solder?
    • June 1-4, Las Vegas, Nevada
    • Tunga, K., Kacher, K., Pucha, R.V., and Sitaraman, S.K., "Accelerated Thermal Cycling: Is It Different for Lead-free solder?", 54th ECTC, June 1-4, 2004, Las Vegas, Nevada, pp. 1579-1585.
    • (2004) 54th ECTC , pp. 1579-1585
    • Tunga, K.1    Kacher, K.2    Pucha, R.V.3    Sitaraman, S.K.4
  • 5
    • 0040489198 scopus 로고    scopus 로고
    • CBGA solder joint reliability evaluation based on elastic-plastic-creep analysis
    • Sept.
    • Pang, H.L.J., Seetoh, C.W., and Wang, Z.P., "CBGA Solder Joint Reliability Evaluation Based on Elastic-Plastic-Creep Analysis", Journal of Electronic Packaging, Vol. 122, 2000, Sept., pp. 255-261.
    • (2000) Journal of Electronic Packaging , vol.122 , pp. 255-261
    • Pang, H.L.J.1    Seetoh, C.W.2    Wang, Z.P.3
  • 6
    • 0035521094 scopus 로고    scopus 로고
    • Flip chip on board solder joint reliability analysis using 2-D and 3-D FEA models
    • Nov.
    • Pang, H.L.J., and Chong, Y.R., "Flip Chip on Board Solder Joint Reliability Analysis Using 2-D and 3-D FEA Models", IEEE Transaction on Advanced Packaging, Vol.24, No.4, 2001, Nov., pp. 499-506.
    • (2001) IEEE Transaction on Advanced Packaging , vol.24 , Issue.4 , pp. 499-506
    • Pang, H.L.J.1    Chong, Y.R.2
  • 7
    • 0345761131 scopus 로고    scopus 로고
    • Three-dimensional versus two-dimensional finite element modeling of flip-chip packages
    • Yao, Q., and Qu, J., "Three-Dimensional Versus Two-Dimensional Finite Element Modeling of Flip-Chip Packages", Journal of Electronic Packaging, Vol. 121, 1999, pp. 196-201.
    • (1999) Journal of Electronic Packaging , vol.121 , pp. 196-201
    • Yao, Q.1    Qu, J.2
  • 8
    • 10444227276 scopus 로고    scopus 로고
    • Modeling thermo-mechanical reliability of bumpless flip chip package
    • June 1-4, Las Vegas, Nevada
    • Che, F.X., Low, T.H., Pang, H.L.J., Lin, W. C.C., Chiang, C. L.S., and Yang T. K. A., "Modeling Thermo-Mechanical Reliability of Bumpless Flip Chip Package", 54th ECTC, June 1-4, 2004, Las Vegas, Nevada, pp.421-426.
    • (2004) 54th ECTC , pp. 421-426
    • Che, F.X.1    Low, T.H.2    Pang, H.L.J.3    Lin, W.C.C.4    Chiang, C.L.S.5    Yang, T.K.A.6
  • 9
    • 0035248513 scopus 로고    scopus 로고
    • The effect of underfill and its material models on thermomechanical behaviors of a flip chip package
    • February
    • Chen, L., Zhang, Q., Wang, G.Z., Xie, X.M., and Cheng, Z.N., "The Effect of Underfill and Its Material Models on Thermomechanical Behaviors of a Flip Chip Package", IEEE Transaction on Advanced Packaging, Vol. 24, No.1, February 2001, pp. 17-24.
    • (2001) IEEE Transaction on Advanced Packaging , vol.24 , Issue.1 , pp. 17-24
    • Chen, L.1    Zhang, Q.2    Wang, G.Z.3    Xie, X.M.4    Cheng, Z.N.5
  • 10
    • 24644483221 scopus 로고    scopus 로고
    • Thermal fatigue reliability analysis for PBGA with Sn-3.8Ag-0.7Cu solder joints
    • December 8-10, Pan Pacific Hotel, Singapore
    • Che, F.X., and Pang, H.L.J., "Thermal Fatigue Reliability Analysis for PBGA with Sn-3.8Ag-0.7Cu Solder Joints", 6th EPTC, December 8-10, 2004, Pan Pacific Hotel, Singapore.pp.787-792.
    • (2004) 6th EPTC , pp. 787-792
    • Che, F.X.1    Pang, H.L.J.2
  • 11
    • 84954065778 scopus 로고    scopus 로고
    • Design for Reliability (DFR) methodology for electronic packaging assemblies
    • December 10-12, Singapore
    • Pang, H.L.J., Low, T.H., Xiong, B.S. and Che, F.X., "Design For Reliability (DFR) Methodology For Electronic Packaging Assemblies", 5th EPTC, December 10-12, 2003, Singapore, pp. 470-478.
    • (2003) 5th EPTC , pp. 470-478
    • Pang, H.L.J.1    Low, T.H.2    Xiong, B.S.3    Che, F.X.4
  • 12
    • 0033322723 scopus 로고    scopus 로고
    • Characterization of chip scale packaging materials
    • Amagai, M., "Characterization of Chip Scale Packaging Materials," Microelectronics Reliability (39) 1999, pp. 1365-1377.
    • (1999) Microelectronics Reliability , Issue.39 , pp. 1365-1377
    • Amagai, M.1
  • 13
    • 3843049137 scopus 로고    scopus 로고
    • Modeling stress strain curves for lead-free 95.5Sn-3.8Ag-0.7Cu solder
    • May 9-12, Brussels, Belgium
    • Pang, H.L.J., Xiong, B.S. and Che, F.X., "Modeling Stress Strain Curves For Lead-Free 95.5Sn-3.8Ag-0.7Cu Solder", Eurosim 2004, May 9-12, 2004, Brussels, Belgium, pp. 449-453.
    • (2004) Eurosim 2004 , pp. 449-453
    • Pang, H.L.J.1    Xiong, B.S.2    Che, F.X.3
  • 14
    • 4444309240 scopus 로고    scopus 로고
    • Lead-free 95.5Sn-3.8Ag-0.7Cu solder joint reliability analysis for micro-BGA assembly
    • Las Vegas, June 1-4
    • Pang, H.L.J., Low, T.H, and Xiong, B.S, "Lead-Free 95.5Sn-3.8Ag-0.7Cu Solder Joint Reliability Analysis For Micro-BGA Assembly", InterTherm 2004, Las Vegas, June 1-4, 2004, pp.131-136.
    • (2004) InterTherm 2004 , pp. 131-136
    • Pang, H.L.J.1    Low, T.H.2    Xiong, B.S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.