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1
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0038162826
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JEDEC Standard, JESD22-A104B, July
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JEDEC Standard, JESD22-A104B, Temperature Cycling, July 2000.
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(2000)
Temperature Cycling
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2
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0034479828
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Effect of simulation methodology on solder joint crack growth correlation
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May 21-24, Las Vegas, Nevada
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Darveaux, R., "Effect of Simulation Methodology on Solder Joint Crack Growth Correlation", 50th ECTC, May 21-24, 2000, Las Vegas, Nevada, pp. 1048-1058.
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50th ECTC
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Darveaux, R.1
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3
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10444263028
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Accelerated thermal cycling: Is it different for lead-free solder?
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June 1-4, Las Vegas, Nevada
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Tunga, K., Kacher, K., Pucha, R.V., and Sitaraman, S.K., "Accelerated Thermal Cycling: Is It Different for Lead-free solder?", 54th ECTC, June 1-4, 2004, Las Vegas, Nevada, pp. 1579-1585.
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54th ECTC
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Tunga, K.1
Kacher, K.2
Pucha, R.V.3
Sitaraman, S.K.4
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4
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0035694182
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Thermal cycling analysis of flip-chip solder joint reliability
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Pang, J.H.J., Chong, D.Y.R., and Low, T.H, "Thermal Cycling Analysis of Flip-Chip Solder Joint Reliability", IEEE Transaction on Components and Packaging Technologies, Vol. 24, No.4, 2001, pp. 705-712.
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IEEE Transaction on Components and Packaging Technologies
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Pang, J.H.J.1
Chong, D.Y.R.2
Low, T.H.3
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5
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0040489198
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CBGA solder joint reliability evaluation based on elastic-plastic-creep analysis
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Sept.
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Pang, H.L.J., Seetoh, C.W., and Wang, Z.P., "CBGA Solder Joint Reliability Evaluation Based on Elastic-Plastic-Creep Analysis", Journal of Electronic Packaging, Vol. 122, 2000, Sept., pp. 255-261.
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Journal of Electronic Packaging
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Pang, H.L.J.1
Seetoh, C.W.2
Wang, Z.P.3
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6
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0035521094
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Flip chip on board solder joint reliability analysis using 2-D and 3-D FEA models
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Nov.
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Pang, H.L.J., and Chong, Y.R., "Flip Chip on Board Solder Joint Reliability Analysis Using 2-D and 3-D FEA Models", IEEE Transaction on Advanced Packaging, Vol.24, No.4, 2001, Nov., pp. 499-506.
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IEEE Transaction on Advanced Packaging
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Pang, H.L.J.1
Chong, Y.R.2
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7
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0345761131
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Three-dimensional versus two-dimensional finite element modeling of flip-chip packages
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Yao, Q., and Qu, J., "Three-Dimensional Versus Two-Dimensional Finite Element Modeling of Flip-Chip Packages", Journal of Electronic Packaging, Vol. 121, 1999, pp. 196-201.
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Journal of Electronic Packaging
, vol.121
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Yao, Q.1
Qu, J.2
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8
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10444227276
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Modeling thermo-mechanical reliability of bumpless flip chip package
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June 1-4, Las Vegas, Nevada
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Che, F.X., Low, T.H., Pang, H.L.J., Lin, W. C.C., Chiang, C. L.S., and Yang T. K. A., "Modeling Thermo-Mechanical Reliability of Bumpless Flip Chip Package", 54th ECTC, June 1-4, 2004, Las Vegas, Nevada, pp.421-426.
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(2004)
54th ECTC
, pp. 421-426
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Che, F.X.1
Low, T.H.2
Pang, H.L.J.3
Lin, W.C.C.4
Chiang, C.L.S.5
Yang, T.K.A.6
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9
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0035248513
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The effect of underfill and its material models on thermomechanical behaviors of a flip chip package
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February
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Chen, L., Zhang, Q., Wang, G.Z., Xie, X.M., and Cheng, Z.N., "The Effect of Underfill and Its Material Models on Thermomechanical Behaviors of a Flip Chip Package", IEEE Transaction on Advanced Packaging, Vol. 24, No.1, February 2001, pp. 17-24.
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IEEE Transaction on Advanced Packaging
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Chen, L.1
Zhang, Q.2
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Xie, X.M.4
Cheng, Z.N.5
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10
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24644483221
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Thermal fatigue reliability analysis for PBGA with Sn-3.8Ag-0.7Cu solder joints
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December 8-10, Pan Pacific Hotel, Singapore
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Che, F.X., and Pang, H.L.J., "Thermal Fatigue Reliability Analysis for PBGA with Sn-3.8Ag-0.7Cu Solder Joints", 6th EPTC, December 8-10, 2004, Pan Pacific Hotel, Singapore.pp.787-792.
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6th EPTC
, pp. 787-792
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Che, F.X.1
Pang, H.L.J.2
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11
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84954065778
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Design for Reliability (DFR) methodology for electronic packaging assemblies
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December 10-12, Singapore
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Pang, H.L.J., Low, T.H., Xiong, B.S. and Che, F.X., "Design For Reliability (DFR) Methodology For Electronic Packaging Assemblies", 5th EPTC, December 10-12, 2003, Singapore, pp. 470-478.
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(2003)
5th EPTC
, pp. 470-478
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Pang, H.L.J.1
Low, T.H.2
Xiong, B.S.3
Che, F.X.4
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12
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0033322723
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Characterization of chip scale packaging materials
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Amagai, M., "Characterization of Chip Scale Packaging Materials," Microelectronics Reliability (39) 1999, pp. 1365-1377.
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Microelectronics Reliability
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Amagai, M.1
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13
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3843049137
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Modeling stress strain curves for lead-free 95.5Sn-3.8Ag-0.7Cu solder
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May 9-12, Brussels, Belgium
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Pang, H.L.J., Xiong, B.S. and Che, F.X., "Modeling Stress Strain Curves For Lead-Free 95.5Sn-3.8Ag-0.7Cu Solder", Eurosim 2004, May 9-12, 2004, Brussels, Belgium, pp. 449-453.
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Eurosim 2004
, pp. 449-453
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Pang, H.L.J.1
Xiong, B.S.2
Che, F.X.3
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14
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4444309240
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Lead-free 95.5Sn-3.8Ag-0.7Cu solder joint reliability analysis for micro-BGA assembly
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Las Vegas, June 1-4
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Pang, H.L.J., Low, T.H, and Xiong, B.S, "Lead-Free 95.5Sn-3.8Ag-0.7Cu Solder Joint Reliability Analysis For Micro-BGA Assembly", InterTherm 2004, Las Vegas, June 1-4, 2004, pp.131-136.
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InterTherm 2004
, pp. 131-136
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Pang, H.L.J.1
Low, T.H.2
Xiong, B.S.3
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