-
1
-
-
33646922057
-
The Future of Wires
-
Ho, R., Mai, K. W., and Horowitz, M. A., 2004, "The Future of Wires," Proc. IEEE, 89, pp. 490-504.
-
(2004)
Proc. IEEE
, vol.89
, pp. 490-504
-
-
Ho, R.1
Mai, K.W.2
Horowitz, M.A.3
-
2
-
-
4544293938
-
Future Microprocessors and Off-Chip SOP Interconnect
-
Hofstee, H. P., 2004, "Future Microprocessors and Off-Chip SOP Interconnect," IEEE Trans. Adv. Packag., 27, pp. 301-313.
-
(2004)
IEEE Trans. Adv. Packag
, vol.27
, pp. 301-313
-
-
Hofstee, H.P.1
-
3
-
-
85199280786
-
-
http://public.itrs.net, International Technology Roadmap for Semiconductors, 2005.
-
(2005)
-
-
-
4
-
-
24644488936
-
Assembly and Reliability Assessment of Lithography-Based Wafer-Level Compliant Chip-To-Substrate Interconnects
-
Kacker, K., Lo, G., and Sitaraman, S. K., 2005, "Assembly and Reliability Assessment of Lithography-Based Wafer-Level Compliant Chip-To-Substrate Interconnects," 2005 Proceedings of the 55th Electronic Components and Technology, Pt. 1, pp. 545-550.
-
(2005)
2005 Proceedings of the 55th Electronic Components and Technology
, Issue.PART. 1
, pp. 545-550
-
-
Kacker, K.1
Lo, G.2
Sitaraman, S.K.3
-
5
-
-
12344311066
-
Development of G-Helix Structure as Off-Chip Interconnect
-
Zhu, Q., Ma, L., and Sitaraman, S. K., 2004, "Development of G-Helix Structure as Off-Chip Interconnect," ASME J. Electron. Packag., 126, pp. 237-246.
-
(2004)
ASME J. Electron. Packag
, vol.126
, pp. 237-246
-
-
Zhu, Q.1
Ma, L.2
Sitaraman, S.K.3
-
6
-
-
10444239308
-
Compliant Die-Package Interconnects at High Frequencies
-
Las Vegas, NV, pp
-
Braunisch, H., Hwang, K., and Emery, R. D., 2004, "Compliant Die-Package Interconnects at High Frequencies," Proceedings of the 54th Electronic Components and Technology Conference, Las Vegas, NV, pp. 1237-1243.
-
(2004)
Proceedings of the 54th Electronic Components and Technology Conference
, pp. 1237-1243
-
-
Braunisch, H.1
Hwang, K.2
Emery, R.D.3
-
7
-
-
12344260457
-
Asymmetric Accelerated Thermal Cycles: An Alternative Approach to Accelerated Reliability Assessment of Microelectronic Packages
-
Classe, F. C., and Sitaraman, S. K., 2003, "Asymmetric Accelerated Thermal Cycles: An Alternative Approach to Accelerated Reliability Assessment of Microelectronic Packages," Proceedings of the Fifth Electronics Packaging Technology Conference.
-
(2003)
Proceedings of the Fifth Electronics Packaging Technology Conference
-
-
Classe, F.C.1
Sitaraman, S.K.2
-
8
-
-
33744783713
-
Flip Chip Solder Joint Reliability Analysis Using Viscoplastic and Elastic-Plastic-Creep Constitutive Models
-
Yeo, A., Lee, C., and Pang, J. H. L., 2006, "Flip Chip Solder Joint Reliability Analysis Using Viscoplastic and Elastic-Plastic-Creep Constitutive Models," IEEE Trans. Compon. Packag. Technol., 29(2), pp. 355-363.
-
(2006)
IEEE Trans. Compon. Packag. Technol
, vol.29
, Issue.2
, pp. 355-363
-
-
Yeo, A.1
Lee, C.2
Pang, J.H.L.3
-
9
-
-
0034476176
-
Finite Element Modeling of BGA Packages for Life Prediction
-
Gustafsson, G., Guven, I., Kradinov, V., and Madenci, E., 2000, "Finite Element Modeling of BGA Packages for Life Prediction," 2000 Proceedings of the 50th Electronic Components and Technology Conference, pp. 1059-1063.
-
(2000)
2000 Proceedings of the 50th Electronic Components and Technology Conference
, pp. 1059-1063
-
-
Gustafsson, G.1
Guven, I.2
Kradinov, V.3
Madenci, E.4
-
11
-
-
0040748904
-
Applying Anand Model to Represent the Viscoplastic Deformation Behavior of Solder Alloys
-
Wang, G. Z., Cheng, Z. N., Becker, K., and Wilde, J., 2001, "Applying Anand Model to Represent the Viscoplastic Deformation Behavior of Solder Alloys," ASME J. Electron. Packag., 123, pp. 247-253.
-
(2001)
ASME J. Electron. Packag
, vol.123
, pp. 247-253
-
-
Wang, G.Z.1
Cheng, Z.N.2
Becker, K.3
Wilde, J.4
-
13
-
-
0029235549
-
A Thermo-Mechanical Fatigue Analysis of High Density Interconnect Vias
-
Prabhu, A. S., Barker, D. B., and Pecht, M. G., 1995, "A Thermo-Mechanical Fatigue Analysis of High Density Interconnect Vias," ASME Advances in Electronic Packaging, 10(1), pp. 187-216.
-
(1995)
ASME Advances in Electronic Packaging
, vol.10
, Issue.1
, pp. 187-216
-
-
Prabhu, A.S.1
Barker, D.B.2
Pecht, M.G.3
-
14
-
-
0141891613
-
Mechanical and Electrical Considerations of Compliant Interconnect
-
Intel Corporation, Internal Project Report
-
Intel Corporation, 2001, "Mechanical and Electrical Considerations of Compliant Interconnect," Internal Project Report.
-
(2001)
-
-
-
15
-
-
85199280108
-
Thermal Cycling Standard
-
JEDEC Solid State Technology Association
-
JEDEC Solid State Technology Association, 2000, Thermal Cycling Standard No. JESD22-A104-B.
-
(2000)
JESD22-A104-B
-
-
|