메뉴 건너뛰기




Volumn 129, Issue 4, 2007, Pages 460-468

A heterogeneous array of off-chip interconnects for optimum mechanical and electrical performance

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIELECTRIC MATERIALS; ELECTRIC PROPERTIES; ELECTROPLATING; FINITE ELEMENT METHOD; MICROPROCESSOR CHIPS; SEMICONDUCTOR MATERIALS; THERMAL EXPANSION;

EID: 38749094088     PISSN: 10437398     EISSN: 15289044     Source Type: Journal    
DOI: 10.1115/1.2804096     Document Type: Article
Times cited : (8)

References (15)
  • 1
    • 33646922057 scopus 로고    scopus 로고
    • The Future of Wires
    • Ho, R., Mai, K. W., and Horowitz, M. A., 2004, "The Future of Wires," Proc. IEEE, 89, pp. 490-504.
    • (2004) Proc. IEEE , vol.89 , pp. 490-504
    • Ho, R.1    Mai, K.W.2    Horowitz, M.A.3
  • 2
    • 4544293938 scopus 로고    scopus 로고
    • Future Microprocessors and Off-Chip SOP Interconnect
    • Hofstee, H. P., 2004, "Future Microprocessors and Off-Chip SOP Interconnect," IEEE Trans. Adv. Packag., 27, pp. 301-313.
    • (2004) IEEE Trans. Adv. Packag , vol.27 , pp. 301-313
    • Hofstee, H.P.1
  • 3
    • 85199280786 scopus 로고    scopus 로고
    • http://public.itrs.net, International Technology Roadmap for Semiconductors, 2005.
    • (2005)
  • 4
    • 24644488936 scopus 로고    scopus 로고
    • Assembly and Reliability Assessment of Lithography-Based Wafer-Level Compliant Chip-To-Substrate Interconnects
    • Kacker, K., Lo, G., and Sitaraman, S. K., 2005, "Assembly and Reliability Assessment of Lithography-Based Wafer-Level Compliant Chip-To-Substrate Interconnects," 2005 Proceedings of the 55th Electronic Components and Technology, Pt. 1, pp. 545-550.
    • (2005) 2005 Proceedings of the 55th Electronic Components and Technology , Issue.PART. 1 , pp. 545-550
    • Kacker, K.1    Lo, G.2    Sitaraman, S.K.3
  • 5
    • 12344311066 scopus 로고    scopus 로고
    • Development of G-Helix Structure as Off-Chip Interconnect
    • Zhu, Q., Ma, L., and Sitaraman, S. K., 2004, "Development of G-Helix Structure as Off-Chip Interconnect," ASME J. Electron. Packag., 126, pp. 237-246.
    • (2004) ASME J. Electron. Packag , vol.126 , pp. 237-246
    • Zhu, Q.1    Ma, L.2    Sitaraman, S.K.3
  • 7
    • 12344260457 scopus 로고    scopus 로고
    • Asymmetric Accelerated Thermal Cycles: An Alternative Approach to Accelerated Reliability Assessment of Microelectronic Packages
    • Classe, F. C., and Sitaraman, S. K., 2003, "Asymmetric Accelerated Thermal Cycles: An Alternative Approach to Accelerated Reliability Assessment of Microelectronic Packages," Proceedings of the Fifth Electronics Packaging Technology Conference.
    • (2003) Proceedings of the Fifth Electronics Packaging Technology Conference
    • Classe, F.C.1    Sitaraman, S.K.2
  • 8
    • 33744783713 scopus 로고    scopus 로고
    • Flip Chip Solder Joint Reliability Analysis Using Viscoplastic and Elastic-Plastic-Creep Constitutive Models
    • Yeo, A., Lee, C., and Pang, J. H. L., 2006, "Flip Chip Solder Joint Reliability Analysis Using Viscoplastic and Elastic-Plastic-Creep Constitutive Models," IEEE Trans. Compon. Packag. Technol., 29(2), pp. 355-363.
    • (2006) IEEE Trans. Compon. Packag. Technol , vol.29 , Issue.2 , pp. 355-363
    • Yeo, A.1    Lee, C.2    Pang, J.H.L.3
  • 11
    • 0040748904 scopus 로고    scopus 로고
    • Applying Anand Model to Represent the Viscoplastic Deformation Behavior of Solder Alloys
    • Wang, G. Z., Cheng, Z. N., Becker, K., and Wilde, J., 2001, "Applying Anand Model to Represent the Viscoplastic Deformation Behavior of Solder Alloys," ASME J. Electron. Packag., 123, pp. 247-253.
    • (2001) ASME J. Electron. Packag , vol.123 , pp. 247-253
    • Wang, G.Z.1    Cheng, Z.N.2    Becker, K.3    Wilde, J.4
  • 13
    • 0029235549 scopus 로고
    • A Thermo-Mechanical Fatigue Analysis of High Density Interconnect Vias
    • Prabhu, A. S., Barker, D. B., and Pecht, M. G., 1995, "A Thermo-Mechanical Fatigue Analysis of High Density Interconnect Vias," ASME Advances in Electronic Packaging, 10(1), pp. 187-216.
    • (1995) ASME Advances in Electronic Packaging , vol.10 , Issue.1 , pp. 187-216
    • Prabhu, A.S.1    Barker, D.B.2    Pecht, M.G.3
  • 14
    • 0141891613 scopus 로고    scopus 로고
    • Mechanical and Electrical Considerations of Compliant Interconnect
    • Intel Corporation, Internal Project Report
    • Intel Corporation, 2001, "Mechanical and Electrical Considerations of Compliant Interconnect," Internal Project Report.
    • (2001)
  • 15
    • 85199280108 scopus 로고    scopus 로고
    • Thermal Cycling Standard
    • JEDEC Solid State Technology Association
    • JEDEC Solid State Technology Association, 2000, Thermal Cycling Standard No. JESD22-A104-B.
    • (2000) JESD22-A104-B


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.