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Volumn 126, Issue 2, 2004, Pages 237-246

Development of G-Helix structure as off-chip interconnect

Author keywords

[No Author keywords available]

Indexed keywords

COSTS; DIELECTRIC MATERIALS; ELECTRONICS PACKAGING; ELECTROPLATING; FABRICATION; INTEGRATED CIRCUITS; MICROPROCESSOR CHIPS; RELIABILITY; SEMICONDUCTOR MATERIALS; SILICON WAFERS; SOLDERING ALLOYS; STRAIN; STRESS CONCENTRATION;

EID: 12344311066     PISSN: 10437398     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1756148     Document Type: Article
Times cited : (33)

References (18)
  • 2
    • 0142172621 scopus 로고    scopus 로고
    • Chip-scale package assembly reliability
    • Nov.
    • Ghaffarian, R., 1998, "Chip-Scale Package Assembly Reliability," Chip Scale, Nov.
    • (1998) Chip Scale
    • Ghaffarian, R.1
  • 12
    • 85199305837 scopus 로고    scopus 로고
    • Mechanical and electrical considerations of compliant interconnect
    • Intel Corporation, 2001, "Mechanical and Electrical Considerations of Compliant Interconnect," Internal Project Report.
    • (2001) Internal Project Report
  • 14
    • 85199298654 scopus 로고    scopus 로고
    • Assembly for the compliant interconnect, intel corporation
    • Intel Corporation, 2002, "Assembly for the Compliant Interconnect, Intel Corporation," Internal Project Report.
    • (2002) Internal Project Report
  • 16
    • 1242283539 scopus 로고    scopus 로고
    • Center for Information and Numerical Data Analysis and Synthesis (CINDAS)
    • Purdue University, 1999, Microelectronics Packaging Materials Database, Center for Information and Numerical Data Analysis and Synthesis (CINDAS).
    • (1999) Microelectronics Packaging Materials Database
  • 17
    • 0026376187 scopus 로고
    • Predicting plated-through-hole reliability in high-temperature manufacturing process
    • Iannuzzelli, R., 1991, "Predicting Plated-Through-Hole Reliability in High-Temperature Manufacturing Process." Proc. of 41th Electronic Components and Technology Conf., pp. 410-421.
    • (1991) Proc. of 41th Electronic Components and Technology Conf. , pp. 410-421
    • Iannuzzelli, R.1
  • 18
    • 0000619691 scopus 로고
    • Thermomechanical fatigue life prediction of 63Sn/37Pb solder
    • Guo, Q., Cutiongco, E. C., Keer, L. M., and Fine, M. E., 1992, "Thermomechanical Fatigue Life Prediction of 63Sn/37Pb Solder," ASME J. Electron. Packag., 114(2), pp. 145-150.
    • (1992) ASME J. Electron. Packag. , vol.114 , Issue.2 , pp. 145-150
    • Guo, Q.1    Cutiongco, E.C.2    Keer, L.M.3    Fine, M.E.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.