-
2
-
-
0142172621
-
Chip-scale package assembly reliability
-
Nov.
-
Ghaffarian, R., 1998, "Chip-Scale Package Assembly Reliability," Chip Scale, Nov.
-
(1998)
Chip Scale
-
-
Ghaffarian, R.1
-
3
-
-
0038235353
-
Future challenges in electronics packaging
-
Chang, C. S., Oscilouski, A., and Bracken, R. C., 1998, "Future Challenges in Electronics packaging," Circuits & Devices, pp. 45-54.
-
(1998)
Circuits & Devices
, pp. 45-54
-
-
Chang, C.S.1
Oscilouski, A.2
Bracken, R.C.3
-
4
-
-
1242283543
-
Design and fabrication of β-fly - A chip-to-substrate interconnect
-
Zhu, Q., Ma, L., and Sitaraman, S. K., 2002, "Design and Fabrication of β-fly - A Chip-to-Substrate Interconnect," Proceedings of ASME International Mechanical Engineering Congress (ASME IMECE).
-
(2002)
Proceedings of ASME International Mechanical Engineering Congress (ASME IMECE)
-
-
Zhu, Q.1
Ma, L.2
Sitaraman, S.K.3
-
5
-
-
0004253046
-
-
PWS Press, Boston
-
Gere, J. M., and Timoshenko, S. P., 1990, Mechanics of Material, 3rd ed., PWS Press, Boston, pp. 675-685.
-
(1990)
Mechanics of Material, 3rd Ed.
, pp. 675-685
-
-
Gere, J.M.1
Timoshenko, S.P.2
-
6
-
-
0003576168
-
-
Wiley Press, Boston
-
Boresi, A. P., Sidebottom, O. M., Seely, F. B., and Smith, J. O., 1978, Advanced Mechanics of Materials, 4th ed. Wiley Press, Boston, pp. 184.
-
(1978)
Advanced Mechanics of Materials, 4th Ed.
, pp. 184
-
-
Boresi, A.P.1
Sidebottom, O.M.2
Seely, F.B.3
Smith, J.O.4
-
9
-
-
84888831107
-
-
ASME DETC97/DTM3881
-
Simpson, T. W., Peplinski, J., Koch, P. N., and Allen, J., "On the Use of Statistic in Design and the Implications for Deterministic Computer Experiments." 1997, ASME DETC97/DTM3881, pp. 1-4.
-
(1997)
On the Use of Statistic in Design and the Implications for Deterministic Computer Experiments
, pp. 1-4
-
-
Simpson, T.W.1
Peplinski, J.2
Koch, P.N.3
Allen, J.4
-
10
-
-
0004294559
-
-
John Wiley & Sons, New York
-
Myers, R. H., and Montgomery, D. C., 1995, Response Surface Methodology: Process and Product Optimization Using Designed Experiments, 2d ed., John Wiley & Sons, New York, pp. 336-337.
-
(1995)
Response Surface Methodology: Process and Product Optimization Using Designed Experiments, 2d Ed.
, pp. 336-337
-
-
Myers, R.H.1
Montgomery, D.C.2
-
11
-
-
0003754441
-
-
John Wiley & Sons, New York
-
Montgomery, D. C., and Runger, G. C., 1999, Applied Statistics and Probability for Engineers, 2d ed., John Wiley & Sons, New York, pp. 312-313.
-
(1999)
Applied Statistics and Probability for Engineers, 2d Ed.
, pp. 312-313
-
-
Montgomery, D.C.1
Runger, G.C.2
-
12
-
-
85199305837
-
Mechanical and electrical considerations of compliant interconnect
-
Intel Corporation, 2001, "Mechanical and Electrical Considerations of Compliant Interconnect," Internal Project Report.
-
(2001)
Internal Project Report
-
-
-
14
-
-
85199298654
-
Assembly for the compliant interconnect, intel corporation
-
Intel Corporation, 2002, "Assembly for the Compliant Interconnect, Intel Corporation," Internal Project Report.
-
(2002)
Internal Project Report
-
-
-
15
-
-
0032667098
-
Numerical and experimental study of the evolution of stresses in flip-chip assemblies during assembly and thermal cycling
-
Hanna, C., Michaelides, S., Palaniappan, P., Baldwin, D., and Sitaraman, S. K., 1999, "Numerical and Experimental Study of the Evolution of Stresses in Flip-Chip Assemblies during Assembly and Thermal Cycling," Proc. of 49th Electronic Components and Technology Conf., pp. 1001-1009.
-
(1999)
Proc. of 49th Electronic Components and Technology Conf.
, pp. 1001-1009
-
-
Hanna, C.1
Michaelides, S.2
Palaniappan, P.3
Baldwin, D.4
Sitaraman, S.K.5
-
16
-
-
1242283539
-
-
Center for Information and Numerical Data Analysis and Synthesis (CINDAS)
-
Purdue University, 1999, Microelectronics Packaging Materials Database, Center for Information and Numerical Data Analysis and Synthesis (CINDAS).
-
(1999)
Microelectronics Packaging Materials Database
-
-
-
17
-
-
0026376187
-
Predicting plated-through-hole reliability in high-temperature manufacturing process
-
Iannuzzelli, R., 1991, "Predicting Plated-Through-Hole Reliability in High-Temperature Manufacturing Process." Proc. of 41th Electronic Components and Technology Conf., pp. 410-421.
-
(1991)
Proc. of 41th Electronic Components and Technology Conf.
, pp. 410-421
-
-
Iannuzzelli, R.1
-
18
-
-
0000619691
-
Thermomechanical fatigue life prediction of 63Sn/37Pb solder
-
Guo, Q., Cutiongco, E. C., Keer, L. M., and Fine, M. E., 1992, "Thermomechanical Fatigue Life Prediction of 63Sn/37Pb Solder," ASME J. Electron. Packag., 114(2), pp. 145-150.
-
(1992)
ASME J. Electron. Packag.
, vol.114
, Issue.2
, pp. 145-150
-
-
Guo, Q.1
Cutiongco, E.C.2
Keer, L.M.3
Fine, M.E.4
|