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Volumn 556-557, Issue , 2007, Pages 319-322

A study of the Dii defect after electron irradiation and annealing of 4H SiC

Author keywords

Carbon interstitials; DII; Electron irradiation; Local vibrational modes; PL

Indexed keywords

DEFECTS; ELECTRON ENERGY LEVELS; ELECTRONS; SILICON CARBIDE; TEMPERATURE DISTRIBUTION;

EID: 38449118610     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/MSF.556-557.319     Document Type: Conference Paper
Times cited : (4)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.