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Volumn 556-557, Issue , 2007, Pages 319-322
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A study of the Dii defect after electron irradiation and annealing of 4H SiC
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Author keywords
Carbon interstitials; DII; Electron irradiation; Local vibrational modes; PL
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Indexed keywords
DEFECTS;
ELECTRON ENERGY LEVELS;
ELECTRONS;
SILICON CARBIDE;
TEMPERATURE DISTRIBUTION;
ELECTRON ENERGIES;
HIGH TEMPERATURE;
INTERSTITIALS;
LOCAL VIBRATIONAL MODE;
LOW ENERGY ELECTRONS;
SPATIAL VARIATIONS;
TEMPERATURE DEPENDENCE;
ELECTRON IRRADIATION;
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EID: 38449118610
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/www.scientific.net/MSF.556-557.319 Document Type: Conference Paper |
Times cited : (4)
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References (8)
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