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Volumn 5374, Issue PART 1, 2004, Pages 203-208

Nanostructuring of polymers by hot embossing lithography

Author keywords

De embossing; Hot embossing lithography; Large area imprinting; Nanoimprinting

Indexed keywords

COOLING; HEATING; LITHOGRAPHY; NANOSTRUCTURED MATERIALS; SAMPLING; SEPARATION;

EID: 3843095973     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.535741     Document Type: Conference Paper
Times cited : (3)

References (8)
  • 1
    • 0034758414 scopus 로고    scopus 로고
    • Nanoimprint lithography with a commercial 4 inch bond system for hot embossing
    • N.Roos, T.Xuxbacher, T.Glinsner, K.Pfeiffer, H.Schulz, H.C. Scheer, "Nanoimprint Lithography with a Commercial 4 Inch Bond System for Hot Embossing", Proc. SPIE 4343, (2001), 427-435
    • (2001) Proc. SPIE , vol.4343 , pp. 427-435
    • Roos, N.1    Xuxbacher, T.2    Glinsner, T.3    Pfeiffer, K.4    Schulz, H.5    Scheer, H.C.6
  • 4
    • 1542361341 scopus 로고    scopus 로고
    • Micron precision optically aligned method for hotembossing and nanoimprinting
    • Sensors, 2002
    • R. Islam, B. Wieder, P. Lindner, T. Glinsner, C. Schaefer, "Micron precision optically aligned method for hotembossing and nanoimprinting", Sensors, 2002. Proceedings of IEEE 2, (2002), 931-935.
    • (2002) Proceedings of IEEE , vol.2 , pp. 931-935
    • Islam, R.1    Wieder, B.2    Lindner, P.3    Glinsner, T.4    Schaefer, C.5
  • 5
    • 0141613076 scopus 로고    scopus 로고
    • Impact of vacuum environment on the hot embossing process
    • N. Roos, T. Glinsner, H.-C. Scheer, "Impact of vacuum environment on the hot embossing process", Proc. SPIE 5037, (2003), 211-218
    • (2003) Proc. SPIE , vol.5037 , pp. 211-218
    • Roos, N.1    Glinsner, T.2    Scheer, H.-C.3
  • 7
    • 0036381279 scopus 로고    scopus 로고
    • Performance of 4" wafer-scale thermoset working stamps in hot embossing lithography
    • N. Roos, H. Schulz, M. Fink, K. Pfeiffer, F. Osenberg, H.-C. Scheer, "Performance of 4" wafer-scale thermoset working stamps in hot embossing lithography", Proc. SPIE 4688, (2002), 232-239
    • (2002) Proc. SPIE , vol.4688 , pp. 232-239
    • Roos, N.1    Schulz, H.2    Fink, M.3    Pfeiffer, K.4    Osenberg, F.5    Scheer, H.-C.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.