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Volumn 5, Issue 4, 1996, Pages 243-249

Measurement of residual stresses in a plate using a vibrational technique - Application to electrolytic nickel coatings

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; MECHANICAL VARIABLES MEASUREMENT; NICKEL; PLATES (STRUCTURAL COMPONENTS); STRESS ANALYSIS; VIBRATIONS (MECHANICAL);

EID: 0030381136     PISSN: 10577157     EISSN: None     Source Type: Journal    
DOI: 10.1109/84.546404     Document Type: Article
Times cited : (34)

References (10)
  • 1
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    • Fabrication of microstructures with high aspect ratios and great structural heights by synchrotron radiation lithography, galvanoforming and plastic molding
    • E. W. Becker, W. Ehrfeld, P. Hagmann, A. Maner, and D. Münchmeyer, "Fabrication of microstructures with high aspect ratios and great structural heights by synchrotron radiation lithography, galvanoforming and plastic molding," Microelectron. Eng., vol. 35, no. 4, 1986.
    • (1986) Microelectron. Eng. , vol.35 , Issue.4
    • Becker, E.W.1    Ehrfeld, W.2    Hagmann, P.3    Maner, A.4    Münchmeyer, D.5
  • 2
    • 44949275054 scopus 로고
    • Three-dimensioanl fabrication using synchrotron radiation
    • W. Ehrfeld and D. Münchmeyer, "Three-dimensioanl fabrication using synchrotron radiation," Nucl. Instrum. Methods Phys. Res. A, vol. 303, pp 523-531, 1991.
    • (1991) Nucl. Instrum. Methods Phys. Res. A , vol.303 , pp. 523-531
    • Ehrfeld, W.1    Münchmeyer, D.2
  • 3
    • 1842420065 scopus 로고
    • A vibrational technique for stress measurement in films
    • A. Jagota, S. Mazur, and R. J. Farris, "A vibrational technique for stress measurement in films," in Mat. Res. Soc. Symp. Proc., 1990, vol. 188, pp 35-40.
    • (1990) Mat. Res. Soc. Symp. Proc. , vol.188 , pp. 35-40
    • Jagota, A.1    Mazur, S.2    Farris, R.J.3
  • 4
    • 0022928895 scopus 로고
    • Determination of the average stress ans its adjustment in thin silicon membranes used in various lithographies
    • B. A. Anderer and U. F. W. Behringer, "Determination of the average stress ans its adjustment in thin silicon membranes used in various lithographies," Microelectron. Eng., vol. 5, pp. 67-71, 1986.
    • (1986) Microelectron. Eng. , vol.5 , pp. 67-71
    • Anderer, B.A.1    Behringer, U.F.W.2
  • 5
    • 0000490485 scopus 로고
    • The vibration of rectangular plate
    • G. B. Warburton, "The vibration of rectangular plate," in Proc. Inst. Mech. Eng. Ser A, 1954, vol. 168, pp. 371-384.
    • (1954) Proc. Inst. Mech. Eng. Ser A , vol.168 , pp. 371-384
    • Warburton, G.B.1
  • 7
    • 0022308623 scopus 로고
    • Improved version of a polarized beam heterodyne interferometer
    • B. R. McAvoy, Ed.
    • D. Royer, E. Dieulesaint, and Y. Martin, "Improved version of a polarized beam heterodyne interferometer," in IEEE Ultrasonics Symp. Proc., B. R. McAvoy, Ed., 1985, p. 432.
    • (1985) IEEE Ultrasonics Symp. Proc. , pp. 432
    • Royer, D.1    Dieulesaint, E.2    Martin, Y.3
  • 8
    • 0023962776 scopus 로고
    • Heterodyne interferometers: Practical limitations and improvements
    • B. Cretin, W.-X. Xie, S. Wang, and D. Hauden, "Heterodyne interferometers: Practical limitations and improvements," Opt. Commun., vol. 65, pp. 157-162, 1988.
    • (1988) Opt. Commun. , vol.65 , pp. 157-162
    • Cretin, B.1    Xie, W.-X.2    Wang, S.3    Hauden, D.4
  • 9
    • 0018921996 scopus 로고
    • Residual stresses in ground steels
    • H. Dölle and J. B. Cohen, "Residual stresses in ground steels," Met. Trans., vol. 11A, p. 159, 1980.
    • (1980) Met. Trans. , vol.11 A , pp. 159
    • Dölle, H.1    Cohen, J.B.2
  • 10
    • 5844314212 scopus 로고
    • Détermination des contraintes résiduelles par diffraction des rayons X
    • ENSAM, Paris, France
    • L. Castex, J. L. Lebrun, G. Maeder, and J. M. Sprauel, "Détermination des contraintes résiduelles par diffraction des rayons X," in Pub. Sci. Tech., ENSAM, Paris, France, 1981.
    • (1981) Pub. Sci. Tech.
    • Castex, L.1    Lebrun, J.L.2    Maeder, G.3    Sprauel, J.M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.