Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals

Applied Physics Letters

Volumn 92, Issue 1, 2008, Pages

  Liu, Z ^a   Chen, T P ^a   Liu, Y ^a   Ding, L ^a   Yang, M ^a   Wong, J I ^a   Cen, Z H ^a   Li, Y B ^b   Zhang, S ^b   Fung, S ^c  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^c UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; CHARGE TRAPPING; ELECTRIC CONDUCTANCE; MAGNETRON SPUTTERING; NANOCRYSTALS; NITRIDES;

CHARGE DETRAPPING; CURRENT CONDUCTION; LIGHT INDUCED INSTABILITY; ULTRAVIOLET ILLUMINATION;

THIN FILMS;

EID: 38049010867     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2828691     Document Type: Article

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