Evidence of nitric-oxide-induced surface band bending of indium tin oxide

Journal of Applied Physics

Volumn 95, Issue 11 I, 2004, Pages 6273-6276

  Hu, Jianqiao ^a,b   Pan, Jisheng ^a   Zhu, Furong ^a   Gong, Hao ^b  

^a INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; CONTAMINATION; ELECTRIC CONDUCTIVITY; ELECTRONIC PROPERTIES; IN SITU PROCESSING; INTERFACES (MATERIALS); MAGNETRON SPUTTERING; PHOTOIONIZATION; SURFACE PROPERTIES; THICK FILMS; THICKNESS MEASUREMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

ORGANIC INTERFACES; PLASMA CLEANING; SURFACE BAND BENDING; ULTRASONICATORS;

INDIUM COMPOUNDS;

EID: 2942666088     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1719268     Document Type: Article

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