Microstructures of microwave-sintered silicon nitride with zirconia as secondary particulates

Journal of the American Ceramic Society

Volumn 89, Issue 12, 2006, Pages 3770-3777

  Feng, Qiquan ^a,b   Chockalingam, Sreekumar ^a   Earl, David A ^a,b  

^a New York State College of Ceramics at Alfred University   (United States)

^b AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVE SINTERING; MULTIGRAIN JUNCTIONS; N-MELILITES; SELECTED-AREA ELECTRON DIFFRACTION;

GRAIN BOUNDARIES; MICROSTRUCTURE; MICROWAVES; SCANNING ELECTRON MICROSCOPY; SINTERING; X RAY DIFFRACTION; ZIRCONIA;

SILICON NITRIDE;

EID: 37849186180     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2006.01304.x     Document Type: Article

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