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Volumn 20, Issue 14-15, 2000, Pages 2673-2677
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Microstructural development of silicon nitride with aligned β-Si3N4 whiskers
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Author keywords
Aspect ratio; Grain growth; Microstructure final; Si3N4; Whiskers
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Indexed keywords
ASPECT RATIO;
CRYSTAL MICROSTRUCTURE;
CRYSTAL ORIENTATION;
CRYSTAL WHISKERS;
ETCHING;
GRAIN GROWTH;
PHASE TRANSITIONS;
SCANNING ELECTRON MICROSCOPY;
SINTERING;
THERMAL EFFECTS;
X RAY DIFFRACTION ANALYSIS;
PHASE GRAINS;
TAPE CASTING;
WHISKER GRAINS;
SILICON NITRIDE;
COMPOSITE PROPERTY;
FIBER REINFORCED COMPOSITE;
SILICON CARBIDE FIBER;
SINTERING;
STRUCTURAL PROPERTY;
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EID: 0034554552
PISSN: 09552219
EISSN: None
Source Type: Journal
DOI: 10.1016/S0955-2219(00)00147-3 Document Type: Article |
Times cited : (17)
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References (6)
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