Bottom and top AF/FM interfaces of NiFe/FeMn/NiFe trilayers

Applied Surface Science

Volumn 254, Issue 7, 2008, Pages 2114-2119

  Nascimento, V P ^a   Passamani, E C ^b   Alvarenga, A D ^c   Biondo, A ^b   Pelegrini, F ^d   Saitovitch, E Baggio ^e  

^a FEDERAL RURAL UNIVERSITY OF RIO DE JANEIRO   (Brazil)

^b FEDERAL UNIVERSITY OF ESPÍRITO SANTO   (Brazil)

^c INSTITUTO NACIONAL DE METROLOGIA   (Brazil)

^d FEDERAL UNIVERSITY OF GOIÁS   (Brazil)

^e CENTRO BRASILEIRO DE PESQUISAS FÍSICAS   (Brazil)

Author keywords

Exchange bias; Interface roughness; Magnetron sputtering; X ray reflectivity

Indexed keywords

MAGNETRON SPUTTERING; PARAMETER ESTIMATION; REFLECTION; SURFACE CHEMISTRY; X RAY ANALYSIS;

EXCHANGE BIAS; INTERFACE ROUGHNESS; TRILAYERS; X-RAY REFLECTIVITY;

ARGON;

EID: 37849036774     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.08.065     Document Type: Article

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