Asymmetric exchange bias in NiFe/FeMn/NiFe multilayer films

Journal of Magnetism and Magnetic Materials

Volumn 272-276, Issue SUPPL. 1, 2004, Pages

  Lee, Young Woo ^a   Hong, Seongmin ^a   Kim, CheolGi ^a   Kim, Chong Oh ^a  

^a Chungnam National University   (South Korea)

Author keywords

Exchange bias; FeMn; Interface roughness; NiFe

Indexed keywords

HYSTERESIS; IRON COMPOUNDS; MAGNETIC DEVICES; MAGNETRON SPUTTERING; NICKEL COMPOUNDS; SPUTTER DEPOSITION; SURFACE ROUGHNESS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

EXCHANGE BIAS; FEMN; INTERFACE ROUGHNESS; MULTILAYER FILMS; NIFE;

MULTILAYERS;

EID: 23144462371     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2003.12.253     Document Type: Conference Paper

References (3)

1. R. Jungblut, et al., J. Appl. Phys. 75 (1994) 6659.
2. C.-M. Park, et al., J. Appl. Phys. 79 (1996) 6228.
3. L. Ritchie, et al., J. Magn. Magn. Mater. 247 (2002) 187.