NiFe/NiO bilayers with high exchange coupling and low coercive fields

Journal of Applied Physics

Volumn 81, Issue 8 PART 2B, 1997, Pages 4996-4998

  Han, De Hua ^a   Zhu, Jian Gang ^a   Judy, Jack H ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0141489385     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364964     Document Type: Article

References (10)

1. C. Tsang, R. E. Fontana, T. Lin, D. E. Heim, V. S. Speriosu, B. A. Gurney, and M. L. Williams, IEEE Trans. Magn. 30, 3801 (1994).
2. B.A. Dieny, V. S. Speriosu, S. S. Parkin, D. R. Wilholt, and D. Marui, Phys, Rev. B 43, 1297 (1991).
3. C.Tsang and S. K. Decker, J. Appl. Phys. 52, 2465 (1981).
4. T. Lin, C. Tsang, R. E. Fontana, and J. K. Howard, IEEE Trans. Magn. 31, 2585 (1995).
5. M. J. Carey and A. E. Berkowitz, Appl. Phys. Lett. 60, 3060 (1992).
6. T. Lin, D. Mauri, N. Staud, C. Hwang, and J. K. Howard, Appl. Phys. Lett. 65, 1183 (1994).
7. D. H. Han, J. G. Zhu, J. H. Judy, and J. M. Sivertsen, J. Appl. Phys. 81, 340 (1997).
8. A. P. Malozemoff, Phys. Rev. B 35, 3679 (1987); J. Appl. Phys. 63, 3874 (1988).
9. A. P. Malozemoff, Phys. Rev. B 35, 3679 (1987); J. Appl. Phys. 63, 3874 (1988).
10. L. Néel, C. R. Acad. Sci. 255, 1676 (1962).