First-principles investigation of high-κ dielectrics: Comparison between the silicates and oxides of hafnium and zirconium

Physical Review B - Condensed Matter and Materials Physics

Volumn 69, Issue 18, 2004, Pages

  Rignanese, G M ^a   Gonze, X ^a   Jun, Gyuchang ^b   Cho, Kyeongjae ^b   Pasquarello, Alfredo ^c,d  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^b Stanford University   (United States)

^c EPFL   (Switzerland)

^d INSTITUT ROMAND DE RECHERCHE NUMÉRIQUE EN PHYSIQUE DES MATÉRIAUX IRRMA   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

HAFNIUM; OXIDE; OXYGEN DERIVATIVE; SILICATE; SILICON DERIVATIVE; ZIRCONIUM; ZIRCONIUM DERIVATIVE;

ARTICLE; CALCULATION; CHEMICAL ANALYSIS; CHEMICAL STRUCTURE; DENSITY FUNCTIONAL THEORY; DIELECTRIC CONSTANT; ELECTRIC POTENTIAL; PARAMETER; PHASE TRANSITION; PHONON; PHYSICAL CHEMISTRY; STRUCTURE ANALYSIS; VIBRATION;

EID: 37649026786     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.69.184301     Document Type: Article

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