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Volumn 91, Issue 25, 2007, Pages
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Improved electrical performances of plasma-enhanced atomic layer deposited TaCx Ny films by adopting Ar H2 plasma
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC LAYER DEPOSITION;
DIFFUSION;
FILM GROWTH;
OXYGEN;
PLASMAS;
ELEMENTAL DIFFUSION;
REDUCING AGENT;
TA-N BONDS;
THIN FILMS;
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EID: 37549061390
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2825272 Document Type: Article |
Times cited : (21)
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References (13)
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