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Volumn 91, Issue 25, 2007, Pages

Improved electrical performances of plasma-enhanced atomic layer deposited TaCx Ny films by adopting Ar H2 plasma

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LAYER DEPOSITION; DIFFUSION; FILM GROWTH; OXYGEN; PLASMAS;

EID: 37549061390     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2825272     Document Type: Article
Times cited : (21)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.