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Volumn 149, Issue 1, 2002, Pages

Plasma-enhanced atomic layer deposition of Ta-N thin films

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; DEPOSITION; ELECTRIC CONDUCTIVITY; PLASMA APPLICATIONS; POLYCRYSTALLINE MATERIALS; TANTALUM COMPOUNDS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 0036222640     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1423642     Document Type: Article
Times cited : (128)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.