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Volumn 149, Issue 1, 2002, Pages
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Plasma-enhanced atomic layer deposition of Ta-N thin films
a b a |
Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL BONDS;
DEPOSITION;
ELECTRIC CONDUCTIVITY;
PLASMA APPLICATIONS;
POLYCRYSTALLINE MATERIALS;
TANTALUM COMPOUNDS;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
PLASMA ENHANCED ATOMIC LAYER DEPOSITION (PEALD);
ELECTROCHEMISTRY;
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EID: 0036222640
PISSN: 00134651
EISSN: None
Source Type: Journal
DOI: 10.1149/1.1423642 Document Type: Article |
Times cited : (128)
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References (12)
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