Constructive derivation of analog specification test criteria

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2005, Pages 395-400

  Stratigopoulos, Haralampos G D ^a   Makris, Yiorgos ^a  

^a Yale University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG SPECIFICATIONS; FAULT MODEL; HYPERSURFACE; LOW DIMENSIONAL; MEASUREMENT PATTERNS; NEURAL SYSTEMS; PERFORMANCE PARAMETERS; TEST CRITERIA;

SEPARATION;

VLSI CIRCUITS;

EID: 33751073029     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2005.36     Document Type: Conference Paper

References (17)

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