Test-Point Selection and Testability Measures via QR Factorization of Linear Models

IEEE Transactions on Instrumentation and Measurement

Volumn IM-36, Issue 2, 1987, Pages 406-410

  Stenbakken, Gerard N ^a   Souders, T Michael ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING - ALGORITHMS; MATHEMATICAL TECHNIQUES - MATRIX ALGEBRA;

CALIBRATION; FAULT DIAGNOSIS; QR FACTORIZATION; TESTABILITY MEASUREMENTS;

ELECTRIC NETWORKS;

EID: 0022732698     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/TIM.1987.6312710     Document Type: Article

References (13)

1. J. W. Bandler and A. E. Salama, “Fault diagnosis of analog circuits,” Proc. IEEE, vol. 73, no. 8, Aug. 1985.
2. T. N. Trick and Y. Li, “A sensitivity based algorithm for fault isolation in analog circuits,” Proc. IEEE Int'l. Symp. CAS (Newport Beach, CA), 1983.
3. G. N. Stenbakken et al., “Efficient calibration strategies for linear, time invariant systems,” in Proc. 1985 AUTOTESTCON Conf (Long Island, NY), Oct. 1985, pp. 361–366.
4. T. M. Souders and G. N. Stenbakken, “Modeling and test point selection for data converter testing,” in Proc. 1985 Int. Test Conf (Philadelphia, PA), 1985, pp. 813–817.
5. N. Sen and R. Saeks, “Fault diagnosis for linear systems via multifrequency frequency measurements,” IEEE Trans. Circuits Syst., vol. CAS-26, 1979.
6. M. J. Box and N. R. Draper, “Factorial designs, the │x’ │ criterion, and some related matters,” Technometrics, vol. 13, 1971.
7. T. J. Mitchell, “An algorithm for the construction of D-optimal experimental designs,” Technometrics, vol. 16, May 1974.
8. S. J. Leon, Linear Algebra With Applications. New York: Macmillan, 1980.
9. J. J. Dongarra et al., LINPACK User's Guide, Society for Industrial and Applied Mathematics, Philadelphia, PA, 1979.
10. H. S. M. Chen and R. Saeks, “A search algorithm for the solution of the multifrequency fault diagnosis equations,” IEEE Trans. Circuits Syst., vol. CAS-26, July 1979.
11. J. W. Bandler et al., “Fault isolation in linear analog circuits using the L 1 norm,” in Proc. 1982 IEEE Int. Symp. CAS (Rome, Italy), 1982, pp. 1140–1143.
12. J. A. Starzyk and M. A. El-Gamal, “An optimization approach to fault location in analog circuits,” in Proc. European Conf Circuit Theory, Design (Prague, Czechoslavakia), 1985, pp. 70–73.
13. L. Hu et al., “A stochastic model for analog fault diagnosis with tolerance,” in Proc. 1984 IEEE Int. Symp. CAS (Montreal, Canada), 1984, pp. 680–683.