Free charge carriers trapping properties in neutron-irradiated DOFZ silicon pad detectors

IEEE Transactions on Nuclear Science

Volumn 54, Issue 6, 2007, Pages 2701-2705

  Weber, Jens ^a   Klingenberg, Reiner ^a  

^a TU DORTMUND UNIVERSITY   (Germany)

Author keywords

Charge collection; LHC; Neutron induced radiation damage of silicon pad detectors; SuperLHC; Transient current technique; Trapping time

Indexed keywords

CHARGE CARRIERS; ELECTRIC CHARGE; ELECTRON TRAPS; NEUTRON IRRADIATION; PROBABILITY; TRANSIENT ANALYSIS;

CHARGE COLLECTION; NEUTRON INDUCED RADIATION DAMAGE; TRANSIENT CURRENT TECHNIQUE; TRAPPING TIME;

RADIATION DETECTORS;

EID: 37249072864     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.910855     Document Type: Conference Paper

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