Measurement of trapping time constants in proton-irradiated silicon pad detectors

IEEE Transactions on Nuclear Science

Volumn 51, Issue 6 I, 2004, Pages 3055-3062

  Krasel, Olaf ^a   Gößling, Claus ^a   Klingenberg, Reiner ^a   Rajek, Silke ^a   Wunstorf, Renate ^a  

^a TU DORTMUND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CHARGE CARRIERS; OPTIMIZATION; PROBABILITY; PROTONS; SILICON;

COORDINATES; ELECTRON TRAPPING; EXPONENTIATED CURRENTS; HOLE TRAPPING;

PARTICLE DETECTORS;

EID: 3342964086     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.839096     Document Type: Conference Paper

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