Transition path delay faults: A new path delay fault model for small and large delay defects

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 16, Issue 1, 2008, Pages 98-106

  Pomeranz, Irith ^a,b   Reddy, Sudhakar M ^a,c  

^a IEEE   (United States)

^b PURDUE UNIVERSITY   (United States)

^c University of Iowa   (United States)

Author keywords

Delay defects; Fault simulation; Path delay faults; Test generation; Transition faults

Indexed keywords

DELAY DEFECTS; FAULT SIMULATION; PATH DELAY FAULTS;

COMPUTER SIMULATION; DEFECTS; FAULT DETECTION; MATHEMATICAL MODELS;

DELAY CIRCUITS;

EID: 37249063630     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2007.909796     Document Type: Article

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