-
1
-
-
13144266757
-
A Process-Tolerant Cache Architecture for Improved Yield in Nanoscale Technologies
-
A. Agarwal, B. C. Paul, H. Mahmoodi, A. Datta, and K. Roy, "A Process-Tolerant Cache Architecture for Improved Yield in Nanoscale Technologies," IEEE Trans. Very Large Scale Integrated Systems, vol. 13, pp. 27-38, 2005.
-
(2005)
IEEE Trans. Very Large Scale Integrated Systems
, vol.13
, pp. 27-38
-
-
Agarwal, A.1
Paul, B.C.2
Mahmoodi, H.3
Datta, A.4
Roy, K.5
-
2
-
-
36749034769
-
-
AMD, May, Available at
-
AMD, "AMD Processor Pricing", May 2006, Available at http://www.amd.com/pricing
-
(2006)
AMD Processor Pricing
-
-
-
3
-
-
0033895964
-
-
B. S. Amrutur and M. A. Horowitz, Speed and Power Scaling of SRAM's, IEEE Trans. on Solid-State Circuits, 35, pp. 175-1.85, Feb. 2000.
-
B. S. Amrutur and M. A. Horowitz, "Speed and Power Scaling of SRAM's," IEEE Trans. on Solid-State Circuits, vol. 35, pp. 175-1.85, Feb. 2000.
-
-
-
-
4
-
-
0041633858
-
-
S. Borkar, T. Karnik, S. Narendra, J. Tschanz, A. Keshavarzi, and V. De, Parameter Variations and Impact on Circuits and Microarchitectures, In Proc. of Design Automation Conference, 2003.
-
S. Borkar, T. Karnik, S. Narendra, J. Tschanz, A. Keshavarzi, and V. De, "Parameter Variations and Impact on Circuits and Microarchitectures," In Proc. of Design Automation Conference, 2003.
-
-
-
-
5
-
-
33748605292
-
Speed Binning Aware Design Methodology to Improve Profit Under Parameter Variations
-
A. Datta, S. Bhunia, J. H. Choi, S. Mukhopadhyay, and K. Roy, "Speed Binning Aware Design Methodology to Improve Profit Under Parameter Variations," In Asia South Pacific Design Automation Conf., 2006.
-
(2006)
Asia South Pacific Design Automation Conf
-
-
Datta, A.1
Bhunia, S.2
Choi, J.H.3
Mukhopadhyay, S.4
Roy, K.5
-
6
-
-
84886673851
-
Modeling Within-Die Spatial Correlation Effects for Process-Design Co-Optimization
-
P. Friedberg, Y. Cao, J. Cain, R. Wang, J. Rabaey, and C. Spanos, "Modeling Within-Die Spatial Correlation Effects for Process-Design Co-Optimization," In Intl. Symp. on Quality of Electronic Design, 2005.
-
(2005)
Intl. Symp. on Quality of Electronic Design
-
-
Friedberg, P.1
Cao, Y.2
Cain, J.3
Wang, R.4
Rabaey, J.5
Spanos, C.6
-
8
-
-
36749042061
-
-
Intel, Intel Processor Pricing, 2006, Available at http://www.intel.com/intel/finance/pricelist/processor_price_list.pdf
-
Intel, "Intel Processor Pricing", 2006, Available at http://www.intel.com/intel/finance/pricelist/processor_price_list.pdf
-
-
-
-
9
-
-
0346778725
-
-
N. S. Kim, D. Blaauw, and T. Mudge, Leakage Power Optimization Techniques for Ultra Deep Sub-Micron Multi-Level Caches, In Proc. of Intl. Conf. on Computer Aided Design, 2003.
-
N. S. Kim, D. Blaauw, and T. Mudge, "Leakage Power Optimization Techniques for Ultra Deep Sub-Micron Multi-Level Caches," In Proc. of Intl. Conf. on Computer Aided Design, 2003.
-
-
-
-
10
-
-
40349098498
-
-
X. Liang and D. Brooks, Mitigating the Impact of Process Variations on CPU Register File and Execution Units, In Proc. of International Symposium on Microarchitecture, 2006.
-
X. Liang and D. Brooks, "Mitigating the Impact of Process Variations on CPU Register File and Execution Units," In Proc. of International Symposium on Microarchitecture, 2006.
-
-
-
-
12
-
-
40349109002
-
Yield-Aware Cache Architectures
-
S. Ozdemir, D. Sinha, G. Memik, J. Adams, and H. Zhou, "Yield-Aware Cache Architectures," In Intl. Symp. on Microarchitecture, 2006.
-
(2006)
Intl. Symp. on Microarchitecture
-
-
Ozdemir, S.1
Sinha, D.2
Memik, G.3
Adams, J.4
Zhou, H.5
-
13
-
-
84880878340
-
-
Available at
-
Sun, "OpenSPARC T1", Available at http://opensparctl.sunsource. net/index.html
-
OpenSPARC T1
-
-
Sun1
|