메뉴 건너뛰기




Volumn 15, Issue 24, 2007, Pages 16230-16244

Models of dielectric response in disordered solids

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY (SPECIFIC GRAVITY); ELECTRONIC STRUCTURE; NUMERICAL METHODS; PARAMETER ESTIMATION; STATISTICAL METHODS;

EID: 36749037124     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.016230     Document Type: Article
Times cited : (54)

References (28)
  • 1
    • 0009260463 scopus 로고
    • Optical dispersion relations for amorphous semiconductors and amorphous dielectrics
    • A. R. Forouhi and I. Bloomer, "Optical dispersion relations for amorphous semiconductors and amorphous dielectrics," Phys. Rev. B 34, 7018-7026 (1986).
    • (1986) Phys. Rev. B , vol.34 , pp. 7018-7026
    • Forouhi, A.R.1    Bloomer, I.2
  • 2
    • 0001524926 scopus 로고    scopus 로고
    • Parameterization of the optical functions of amorphous materials in the interband region
    • G. E. Jellison and F. A. Modine, "Parameterization of the optical functions of amorphous materials in the interband region," Appl. Phys. Lett. 69, 371-373 (1996).
    • (1996) Appl. Phys. Lett , vol.69 , pp. 371-373
    • Jellison, G.E.1    Modine, F.A.2
  • 3
    • 0036732205 scopus 로고    scopus 로고
    • Analytical model for the optical functions of amorphous semiconductors from the near-infrared to ultraviolet: Applications in thin film, photovoltaics
    • A. S. Ferlauto, G. M. Ferreira, J. M. Pearce, C. R. Wronski, R. W. Collins, X. M. Deng, and G. Ganguly, "Analytical model for the optical functions of amorphous semiconductors from the near-infrared to ultraviolet: Applications in thin film, photovoltaics," J. Appl. Phys. 92, 2424-2436 (2002).
    • (2002) J. Appl. Phys , vol.92 , pp. 2424-2436
    • Ferlauto, A.S.1    Ferreira, G.M.2    Pearce, J.M.3    Wronski, C.R.4    Collins, R.W.5    Deng, X.M.6    Ganguly, G.7
  • 5
    • 84894402984 scopus 로고    scopus 로고
    • J. Taue, Optical Properties of Non-Crystaline Solids, in Optical Properties of Solids, F. Abelès, ed., pp. 277-3.13 (North-Holland, Amsterdam, 1972).
    • J. Taue, "Optical Properties of Non-Crystaline Solids," in Optical Properties of Solids, F. Abelès, ed., pp. 277-3.13 (North-Holland, Amsterdam, 1972).
  • 9
    • 0038580479 scopus 로고    scopus 로고
    • Expression of the Optical Constants of Chalcogenide Thin Films Using the New Parameterization Dispersion Model
    • D. Franta, I. Ohlídal, M. Fruinar, and J. Jedelský, "Expression of the Optical Constants of Chalcogenide Thin Films Using the New Parameterization Dispersion Model," Appl. Surf. Sci. 212-213, 116-121 (2003).
    • (2003) Appl. Surf. Sci , vol.212-213 , pp. 116-121
    • Franta, D.1    Ohlídal, I.2    Fruinar, M.3    Jedelský, J.4
  • 10
    • 2142641654 scopus 로고    scopus 로고
    • Complete Characterization of Rough Polymorphous Silicon Films by Atomic Force Microscopy and the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry
    • D. Franta, I. Ohlídal, P. Klapetek, and P. Roca i Cabarrocas, "Complete Characterization of Rough Polymorphous Silicon Films by Atomic Force Microscopy and the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry," Thin Solid Films 455-456, 399-403 (2004).
    • (2004) Thin Solid Films , vol.455-456 , pp. 399-403
    • Franta, D.1    Ohlídal, I.2    Klapetek, P.3    Roca i Cabarrocas, P.4
  • 14
    • 17144455106 scopus 로고    scopus 로고
    • x Studied by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry
    • x Studied by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry," Thin Solid Films 455-456, 393-398 (2004).
    • (2004) Thin Solid Films , vol.455-456 , pp. 393-398
    • Franta, D.1    Ohlídal, I.2    Buršíková, V.3    Zajíèková, L.4
  • 15
    • 27744500934 scopus 로고    scopus 로고
    • Thermal stability of the optical properties of plasma deposited diamond-like carbon thin films
    • D. Franta, V. Buršíková, I. Ohlídal, L. Zajíčková, and P. Stahel, "Thermal stability of the optical properties of plasma deposited diamond-like carbon thin films," Diamond Relat. Mater. 14, 1795-1798 (2005).
    • (2005) Diamond Relat. Mater , vol.14 , pp. 1795-1798
    • Franta, D.1    Buršíková, V.2    Ohlídal, I.3    Zajíčková, L.4    Stahel, P.5
  • 16
    • 34047247021 scopus 로고    scopus 로고
    • Correlation of thermal stability of the mechanical, and optical properties of diamond-like carbon films
    • D. Franta, V. Buršíková, I. Ohlídal, P. Stahel, M. Ohlídal, and D. Nečas, "Correlation of thermal stability of the mechanical, and optical properties of diamond-like carbon films," Diamond Relat. Mater. 16, 1331-1335 (2007).
    • (2007) Diamond Relat. Mater , vol.16 , pp. 1331-1335
    • Franta, D.1    Buršíková, V.2    Ohlídal, I.3    Stahel, P.4    Ohlídal, M.5    Nečas, D.6
  • 19
    • 0022689415 scopus 로고
    • Mass density and hydrogen concentration in diamond-like carbon films: Proton recoil, mtherford backscattering and ellipsometric analysis
    • D. C. Ingram, J. A. Woollam, and G. Bu-Abbud, "Mass density and hydrogen concentration in diamond-like carbon films: proton recoil, mtherford backscattering and ellipsometric analysis," Thin Solid Films 137, 225-230 (1986).
    • (1986) Thin Solid Films , vol.137 , pp. 225-230
    • Ingram, D.C.1    Woollam, J.A.2    Bu-Abbud, G.3
  • 20
    • 0000653389 scopus 로고
    • Evaluation of the [C(sp3)]/[C(sp2)] ratio in diamondlike films through the use of a complex dielectric constant
    • F. Demichelis, C. F. Pirri, and A. Tagliaferro, "Evaluation of the [C(sp3)]/[C(sp2)] ratio in diamondlike films through the use of a complex dielectric constant," Phys. Rev. B 45, 14,364-14,370 (1992).
    • (1992) Phys. Rev. B , vol.45
    • Demichelis, F.1    Pirri, C.F.2    Tagliaferro, A.3
  • 21
    • 0001134590 scopus 로고
    • Weak Absorption Tails in. Amorphous Semiconductors
    • D. Wood and J. Taue, "Weak Absorption Tails in. Amorphous Semiconductors," Phys. Rev. B 5, 3144-3151 (1972).
    • (1972) Phys. Rev. B , vol.5 , pp. 3144-3151
    • Wood, D.1    Taue, J.2
  • 22
    • 11744257049 scopus 로고    scopus 로고
    • Ellipsometric Parameters and Reflectances of Thin Films with Slightly Rough Boundaries
    • D. Franta and I. Ohlídal, "Ellipsometric Parameters and Reflectances of Thin Films with Slightly Rough Boundaries," J. Mod. Opt. 45, 903-934 (1998).
    • (1998) J. Mod. Opt , vol.45 , pp. 903-934
    • Franta, D.1    Ohlídal, I.2
  • 23
    • 33646657755 scopus 로고
    • 2 in the ultraviolet region
    • 2 in the ultraviolet region," Czech. J. Phys. 19, 1265-1270 (1969).
    • (1969) Czech. J. Phys , vol.19 , pp. 1265-1270
    • Pajasová, L.1
  • 24
    • 84940831542 scopus 로고
    • 2) (Glass)
    • E. Palik, ed, Academic Press, New York
    • 2) (Glass)," in Handbook of Optical Constants of Solids, E. Palik, ed., vol. I, pp. 749-763 (Academic Press, New York, 1985).
    • (1985) Handbook of Optical Constants of Solids , vol.1 , pp. 749-763
    • Philipp, H.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.