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Volumn 44, Issue 7 B, 2005, Pages 5832-5835
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Dependence of acid yield on acid generator in chemically amplified resist for post-optical lithography
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Author keywords
Acid generator; Acid yield; Poly(methyl methacrylate); Post optical lithography; Reaction mechanism
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Indexed keywords
ELECTRON BEAMS;
IONIZING RADIATION;
PHOTOLITHOGRAPHY;
POLYMETHYL METHACRYLATES;
REACTION KINETICS;
ACID GENERATORS;
ACID YIELD;
POST-OPTICAL LITHOGRAPHY;
PHOTORESISTS;
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EID: 31844448318
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.44.5832 Document Type: Article |
Times cited : (18)
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References (18)
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