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Volumn 87, Issue 35, 2007, Pages 5539-5549
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Investigation of the microstructure and optical properties of hydrogenated polymorphous silicon films prepared with pure silane
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS SILICON;
ATOMIC FORCE MICROSCOPY;
CHEMICAL VAPOR DEPOSITION;
ELLIPSOMETRY;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
MICROSTRUCTURE;
OPTICAL PROPERTIES;
X RAY DIFFRACTION ANALYSIS;
GAS PRESSURE;
INTER-ELECTRODE DISTANCE;
X-RAY DIFFRACTION AT GRAZING INCIDENCE ANGLE (XRDGI);
METALLIC FILMS;
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EID: 36248975231
PISSN: 14786435
EISSN: 14786443
Source Type: Journal
DOI: 10.1080/14786430701666190 Document Type: Article |
Times cited : (4)
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References (23)
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