Characteristics of p-type nanocrystalline silicon thin films developed for window layer of solar cells

Journal of Non-Crystalline Solids

Volumn 353, Issue 22-23, 2007, Pages 2289-2294

  Adhikary, Koel ^a   Ray, Swati ^a  

^a DEPARTMENT OF MATERIALS SCIENCE   (India)

Author keywords

Absorption; Conductivity; Crystal growth; Microcrystallinity; Nanocrystals; Nucleation; Photovoltaics; Raman scattering; SEM S100; Silicon; Solar cells; STEM TEM; X ray diffraction

Indexed keywords

ABSORPTION; CRYSTAL GROWTH; ELECTRIC CONDUCTIVITY; NANOCRYSTALS; NUCLEATION; PHOTOVOLTAIC CELLS; RAMAN SCATTERING; SILICON COMPOUNDS; SOLAR CELLS; X RAY DIFFRACTION;

CHAMBER PRESSURES; MICROCRYSTALLINITY; NANOCRYSTALLINE SILICON THIN FILMS; WINDOW LAYERS;

THIN FILMS;

EID: 34248583074     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2007.01.019     Document Type: Article

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