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Volumn 102, Issue 9, 2007, Pages

Deep level thermal evolution in Fe implanted InP

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CURRENT DENSITY; ELECTRON TRAPS; HEAT CONDUCTION; THERMAL EFFECTS;

EID: 36248961008     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2812551     Document Type: Article
Times cited : (4)

References (17)
  • 14
    • 0004200984 scopus 로고
    • edited by S.Pantelides (Gordon and Breach, New York
    • S. G. Bishop, in Deep Centers in Semiconductors, edited by, S. Pantelides, (Gordon and Breach, New York, 1986).
    • (1986) Deep Centers in Semiconductors
    • Bishop, S.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.