Electrical activation of the Fe2+/3+ trap in Fe-implanted InP

Applied Physics Letters

Volumn 87, Issue 25, 2005, Pages 1-3

  Fraboni, B ^a   Gasparotto, A ^b   Cesca, T ^b   Verna, A ^b   Impellizzeri, G ^c   Priolo, F ^c  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b UNIVERSITY OF PADOVA   (Italy)

^c UNIVERSITY OF CATANIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRON TRAPS; FERMI LEVEL; ION IMPLANTATION; IRON; SEMICONDUCTOR DOPING;

DEEP ACCEPTOR TRAPS; ELECTRICAL ACTIVATION; FE ACTIVATION; FE2+/3+ TRAP;

SEMICONDUCTING INDIUM PHOSPHIDE;

EID: 29144519372     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2150281     Document Type: Article

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