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Volumn 49, Issue 12, 2007, Pages 3188-3192

Modeling of dielectric charging in RF MEMS capacitive switches

Author keywords

Capacitive switches; Dielectric charging; RF MEMS; Surface roughness

Indexed keywords

CAPACITIVE SWITCHES; DIELECTRIC CHARGING; MACROSCOPICS; QUANTITATIVE DESCRIPTIONS;

EID: 36148968036     PISSN: 08952477     EISSN: None     Source Type: Journal    
DOI: 10.1002/mop.22903     Document Type: Article
Times cited : (18)

References (13)
  • 1
    • 0038374162 scopus 로고    scopus 로고
    • MEMS for wireless communications: From RF-MEMS components to RF-MEMS-SIP
    • H.A.C. Tillmans, W.D. Raedt, and E. Beyne, MEMS for wireless communications: From RF-MEMS components to RF-MEMS-SIP, J Micromech Microeng 13 (2003), S139-S163.
    • (2003) J Micromech Microeng , vol.13
    • Tillmans, H.A.C.1    Raedt, W.D.2    Beyne, E.3
  • 5
    • 33646069253 scopus 로고    scopus 로고
    • Modeling and characterization of dielectric charging effects in RF MEMS capacitive switches
    • Long Beach, CA
    • X. Yuan, J.C.M. Hwang, D. Forehand, and C.L. Goldsmith, Modeling and characterization of dielectric charging effects in RF MEMS capacitive switches, IEEE MTT-S Int Microwave Symp Dig, Long Beach, CA (2005), 753-756.
    • (2005) IEEE MTT-S Int Microwave Symp Dig , pp. 753-756
    • Yuan, X.1    Hwang, J.C.M.2    Forehand, D.3    Goldsmith, C.L.4
  • 7
    • 2342642163 scopus 로고    scopus 로고
    • A comprehensive model to predict the charging and reliability of capacitive RF MRMS switches
    • W.M.v. Spengen, R. Peurs, R. Mertens, and I.D. Wolf, A comprehensive model to predict the charging and reliability of capacitive RF MRMS switches, J Micromech Microeng 14 (2004), 514-521.
    • (2004) J Micromech Microeng , vol.14 , pp. 514-521
    • Spengen, W.M.V.1    Peurs, R.2    Mertens, R.3    Wolf, I.D.4
  • 10
    • 33748801255 scopus 로고    scopus 로고
    • Effects of surface roughness on electromagnetic characteristics of capacitive switches
    • A.B. Yu, A.Q. Liu, Q.X. Zhang, and H.M. Hosseini, Effects of surface roughness on electromagnetic characteristics of capacitive switches, J Micromech Microeng 16 (2006), 2157-2166.
    • (2006) J Micromech Microeng , vol.16 , pp. 2157-2166
    • Yu, A.B.1    Liu, A.Q.2    Zhang, Q.X.3    Hosseini, H.M.4
  • 11
    • 34748914488 scopus 로고    scopus 로고
    • A transient SPICE model for dielectric-charging effects in RF MEMS capacitive switches
    • X. Yuan, Z. Peng, J.C.M. Hwang, D. Forehand, and C.L. Goldsmith, A transient SPICE model for dielectric-charging effects in RF MEMS capacitive switches, IEEE Trans Electron Dev 53 (2006), 2640-2648.
    • (2006) IEEE Trans Electron Dev , vol.53 , pp. 2640-2648
    • Yuan, X.1    Peng, Z.2    Hwang, J.C.M.3    Forehand, D.4    Goldsmith, C.L.5
  • 12
    • 0022557924 scopus 로고
    • Comparison of models for the contact of rough surfaces
    • J.I. McCool, Comparison of models for the contact of rough surfaces, Wear 107 (1986), 37-60.
    • (1986) Wear , vol.107 , pp. 37-60
    • McCool, J.I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.