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teXsan: Single Crystal Structure Analysis Software, Version 1.19; Molecular Structure Corporation and Rigaku Corporation: 2000
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teXsan: Single Crystal Structure Analysis Software, Version 1.19; Molecular Structure Corporation and Rigaku Corporation: 2000.
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57
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36048991771
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The devices were degraded gradually under ambient conditions, probably owing to the low oxidation potentials (i.e., high HOMO levels) of 3-7. See Supporting Information.
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The devices were degraded gradually under ambient conditions, probably owing to the low oxidation potentials (i.e., high HOMO levels) of 3-7. See Supporting Information.
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58
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36048983428
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Poor FET characteristics can be ascribed to the less-ordered molecular array in the evaporated thin film of 2. See Supporting Information
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Poor FET characteristics can be ascribed to the less-ordered molecular array in the evaporated thin film of 2. See Supporting Information.
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59
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36048943315
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FET characteristics of P3HT-based devices similarly fabricated are available in the Supporting Information.
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FET characteristics of P3HT-based devices similarly fabricated are available in the Supporting Information.
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