Images of strips on and trenches in substrates

Applied Optics

Volumn 46, Issue 23, 2007, Pages 5571-5587

  Marx, Egon ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; FOURIER OPTICS; INTEGRAL EQUATIONS; MATHEMATICAL MODELS; MAXWELL EQUATIONS; OPTICAL SYSTEMS; SUBSTRATES;

COMPUTED IMAGES; SINGLE-INTEGRAL-EQUATION;

IMAGE ANALYSIS;

EID: 35948995751     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.005571     Document Type: Article

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