Microstructural and chemical transformation of thin Ti/Pd and TiD y /Pd bilayer films induced by vacuum annealing

Analytical and Bioanalytical Chemistry

Volumn 389, Issue 5, 2007, Pages 1489-1498

  Lisowski, W ^a   Keim, E G ^b   Kaszkur, Z ^a   Van Den Berg, A H J ^b   Smithers, M A ^b  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^b UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Annealing; Microstructure; Titanium deuteride; X ray photoelectron spectroscopy

Indexed keywords

ANNEALING; MICROSTRUCTURE; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

BULK MORPHOLOGY; HIGH-TEMPERATURE ANNEALING; TITANIUM DEUTERIDE; X-RAY SPECTROMETRY ANALYSIS;

MULTILAYER FILMS;

EID: 35649013218     PISSN: 16182642     EISSN: 16182650     Source Type: Journal    
DOI: 10.1007/s00216-007-1594-3     Document Type: Article

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