Reference data for Auger electron spectroscopy and X-ray photoelectron spectroscopy combined

Applied Surface Science

Volumn 144-145, Issue , 1999, Pages 161-167

  Seah, M P ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

AES; Intensities; Quantification; Reference data; Sensitivity factors; XPS

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CALIBRATION; COMPUTER AIDED SOFTWARE ENGINEERING; DATABASE SYSTEMS; ELECTRON ENERGY LEVELS; SENSITIVITY ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

REFERENCE DATA; SENSITIVITY FACTORS; SPECTRAL INTENSITIES; X RAY LINESHAPES;

STANDARDIZATION;

EID: 0032675557     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00788-0     Document Type: Article

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