Characterization of titanium hydride films covered by nanoscale evaporated Au layers: ToF-SIMS, XPS and AES depth profile analysis

Surface and Interface Analysis

Volumn 29, Issue 4, 2000, Pages 292-297

  Lisowski, W ^a   Van Den Berg, A H J ^b   Leonard, D ^c   Mathieu, H J ^c  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^b UNIVERSITY OF TWENTE   (Netherlands)

^c EPFL   (Switzerland)

Author keywords

AES depth profiles; Gold; Titanium; Titanium hydride; ToF SIMS; XPS

Indexed keywords

EID: 0003004561     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(200004)29:4<292::AID-SIA863>3.0.CO;2-L     Document Type: Article

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