Structural and chemical characterisation of titanium deuteride films covered by nanoscale evaporated palladium layers

Analytical and Bioanalytical Chemistry

Volumn 385, Issue 4, 2006, Pages 700-707

  Lisowski, W ^a   Keim, E G ^b   Van Den Berg, A H J ^b   Smithers, M A ^b  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^b UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

SEM; TEM; Titanium deuteride; XPS

Indexed keywords

BIMETALS; DEUTERIUM; EVAPORATION; LARGE SCALE SYSTEMS; MORPHOLOGY; PALLADIUM; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SPUTTERING; SURFACE ROUGHNESS; TITANIUM; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

BIMETALLIC STRUCTURE; TITANIUM DEUTERIDE; ULTRA-HIGH VACUUM (UHV); XPS VALENCE-BAND SPECTRA;

THIN FILMS;

EID: 33744901172     PISSN: 16182642     EISSN: 16182650     Source Type: Journal    
DOI: 10.1007/s00216-006-0442-1     Document Type: Article

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