Combined scanning tunneling microscopy and synchrotron X-ray photoemission spectroscopy results on the oxidative CuI film formation on Cu(111)

Journal of Physical Chemistry C

Volumn 111, Issue 40, 2007, Pages 14768-14781

  Hai, Nguyen T M ^a   Huemann, Sascha ^a   Hunger, Ralf ^b   Jaegermann, Wolfram ^b   Wandelt, Klaus ^a   Broekmann, Peter ^a  

^a UNIVERSITY OF BONN   (Germany)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CYCLIC VOLTAMMETRY; DISSOLUTION; IODINE COMPOUNDS; NUCLEATION; OXIDATION; PASSIVATION; SCANNING TUNNELING MICROSCOPY; THREE DIMENSIONAL; X RAY PHOTOELECTRON SPECTROSCOPY;

COPPER OXIDATION; GROWTH MODE; OXIDATIVE DISSOLUTION;

METALLIC FILMS;

EID: 35548964260     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp072826u     Document Type: Article

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