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Volumn 151, Issue 4, 2004, Pages 287-294

Evolution of fault-tolerant and noise-robust digital designs

Author keywords

[No Author keywords available]

Indexed keywords

ADDERS; CMOS INTEGRATED CIRCUITS; COMBINATORIAL CIRCUITS; COMPUTER HARDWARE; COMPUTER SIMULATION; FAULT TOLERANT COMPUTER SYSTEMS; GENETIC ALGORITHMS; INTEGRATED CIRCUIT LAYOUT; MULTIPLYING CIRCUITS; NAND CIRCUITS; SPURIOUS SIGNAL NOISE;

EID: 3543105492     PISSN: 13502387     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1049/ip-cdt:20040014     Document Type: Article
Times cited : (29)

References (28)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.