Evolving robust digital designs

Proceedings - NASA/DoD Conference on Evolvable Hardware, EH

Volumn 2002-January, Issue , 2002, Pages 36-45

  Hartmann, M ^a   Haddow, P ^a   Eskelund, F ^a  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

Author keywords

Adders; Circuit faults; Circuit noise; Circuit testing; Fault tolerance; Hardware; Noise level; Noise robustness; Semiconductor device noise; Working environment noise

Indexed keywords

COMPUTER HARDWARE; FAULT TOLERANCE; HARDWARE; NASA; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR DEVICES;

CIRCUIT FAULTS; CIRCUIT NOISE; CIRCUIT TESTING; NOISE LEVELS; NOISE ROBUSTNESS; SEMICONDUCTOR DEVICE NOISE; WORKING ENVIRONMENT;

ADDERS;

EID: 3543102157     PISSN: 15506029     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EH.2002.1029863     Document Type: Conference Paper

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