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Volumn 2001-January, Issue , 2001, Pages 93-97

Evolvable hardware solutions for extreme temperature electronics

Author keywords

[No Author keywords available]

Indexed keywords

'CURRENT; COMPONENT LEVELS; EVOLVABLE HARDWARE; EXTREME ENVIRONMENT; EXTREME TEMPERATURES; HARDWARE SOLUTIONS; HIGHEST TEMPERATURE; LONG LIFE; NASA MISSIONS; RADIATION TOLERANT;

EID: 84952927417     PISSN: 15506029     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EH.2001.937950     Document Type: Conference Paper
Times cited : (26)

References (12)
  • 2
    • 0033143224 scopus 로고    scopus 로고
    • Physical Limits and Lifetime, "Limitations of Semicondctor Devices at High Temperatures"
    • Wondrak, W. Physical Limits and Lifetime, "Limitations of Semicondctor Devices at High Temperatures", Microelectronics Reliability 39 (1999) 1113-1120.
    • (1999) Microelectronics Reliability , vol.39 , pp. 1113-1120
    • Wondrak, W.1
  • 5
    • 85029454356 scopus 로고    scopus 로고
    • Analog CMOS Integrated Circuits for High-Temperature Operation with Leakage Current Compensation
    • E. Albuquerque
    • Mizuno, K., N. Ohta, F. Kitagawa, H., Nagase, E., "Analog CMOS Integrated Circuits for High-Temperature Operation with Leakage Current Compensation", 4th International High Temperature Electronics Conf., Albuquerque, p. 41, 1998.
    • (1998) 4th International High Temperature Electronics Conf. , pp. 41
    • Mizuno, K.1    Ohta, N.2    Kitagawa, F.3    Nagase, H.4
  • 6
    • 11244254692 scopus 로고    scopus 로고
    • Analyzing Bias Cancellation Techniques for High temperature Analog Applications
    • Albuquerque
    • F. Shi, "Analyzing Bias Cancellation Techniques for High temperature Analog Applications", 4th International High Temperature Electronics Conf., Albuquerque, pp. 172-175, 1998.
    • (1998) 4th International High Temperature Electronics Conf. , pp. 172-175
    • Shi, F.1
  • 7
    • 23044521076 scopus 로고    scopus 로고
    • Evolution of Robustness in an Electronics Design
    • ICES 2000, Edinburgh, UK, April
    • Adrian Thompson and Paul Layzell, "Evolution of Robustness in an Electronics Design" ICES 2000, LNCS 1801, pp. 218-228, Edinburgh, UK, April, 2000.
    • (2000) LNCS , vol.1801 , pp. 218-228
    • Thompson, A.1    Layzell, P.2
  • 9
    • 0035242923 scopus 로고    scopus 로고
    • Reconfigurable VLSI Architectures for Evolvable Hardware: From Experimental Field Programmable Transistor Arrays to Evolution-Oriented Chips
    • February
    • A. Stoica, R. Zebulum, D. Keymeulen, R. Tawel, T. Daud, and A. Thakoor, "Reconfigurable VLSI Architectures for Evolvable Hardware: from Experimental Field Programmable Transistor Arrays to Evolution-Oriented Chips", IEEE Transactions on VLSI Systems, February 2001,227-232.
    • (2001) IEEE Transactions on VLSI Systems , pp. 227-232
    • Stoica, A.1    Zebulum, R.2    Keymeulen, D.3    Tawel, R.4    Daud, T.5    Thakoor, A.6
  • 12
    • 85193245912 scopus 로고    scopus 로고
    • EHWPack: A Parallel Software/Hardware Environment for Evolvable Hardware
    • Whitley Darrell (eds.), July 8-12, Las Vegas, Nevada USA. San Francisco, CA: Morgan Kaufmann
    • D. Keymeulen, G. Klimeck, R. Zebulum, A. Stoica, and C. Lazaro., "EHWPack: A Parallel Software/Hardware Environment for Evolvable Hardware" In Whitley Darrell (eds.), Proceedings of of(GECCO-2000, July 8-12, 2000, Las Vegas, Nevada USA. San Francisco, CA: Morgan Kaufmann.
    • (2000) Proceedings of OfGECCO-2000
    • Keymeulen, D.1    Klimeck, G.2    Zebulum, R.3    Stoica, A.4    Lazaro, C.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.