Evolving messy gates for fault tolerance: Some preliminary findings

Proceedings - NASA/DoD Conference on Evolvable Hardware, EH

Volumn 2001-January, Issue , 2001, Pages 116-123

  Miller, J F ^a   Hartmann, M ^b  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^b NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT TOLERANCE; HARDWARE; NASA;

EVOLUTIONARY DESIGN; EVOLVING CIRCUITS; INTRINSIC EVOLUTION; PHYSICAL CHARACTERISTICS; PRELIMINARY MODEL; RANDOM NOISE;

RECONFIGURABLE HARDWARE;

EID: 3543074153     PISSN: 15506029     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EH.2001.937953     Document Type: Conference Paper

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