Atomistic studies of segregation and diffusion in Al-Cu grain boundaries

Applied Physics Letters

Volumn 72, Issue 13, 1998, Pages 1578-1580

  Liu, X Y ^a   Xu, Wei ^b   Foiles, S M ^c   Adams, J B ^d  

^a University of Illinois at Urbana Champaign   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^c SANDIA NATIONAL LABORATORIES   (United States)

^d ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000511917     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121120     Document Type: Article

References (11)

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