|
Volumn 244, Issue 10, 2007, Pages 3620-3638
|
On the residual stress developed in the nanostructure of computer simulated thin films
c
ARAK UNIVERSITY
(Iran)
|
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 35349013163
PISSN: 03701972
EISSN: 15213951
Source Type: Journal
DOI: 10.1002/pssb.200642199 Document Type: Article |
Times cited : (1)
|
References (38)
|