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Volumn 244, Issue 10, 2007, Pages 3620-3638

On the residual stress developed in the nanostructure of computer simulated thin films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 35349013163     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.200642199     Document Type: Article
Times cited : (1)

References (38)
  • 1
    • 35349024576 scopus 로고    scopus 로고
    • D. S. Campbell, Mechanical Properties of Thin Films, in: Handbook of Thin Film Technology, edited by L. Maissel and R. Glang (McGraw-Hill, New York, 1970), pp. 22-25.
    • D. S. Campbell, Mechanical Properties of Thin Films, in: Handbook of Thin Film Technology, edited by L. Maissel and R. Glang (McGraw-Hill, New York, 1970), pp. 22-25.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.