A fine resolution TDC architecture for next generation PET imaging

IEEE Transactions on Nuclear Science

Volumn 54, Issue 5, 2007, Pages 1574-1582

  Yousif, Abdel S ^b   Haslett, James W ^a,b  

^a IEEE   (Canada)

^b UNIVERSITY OF CALGARY   (Canada)

Author keywords

Analog to digital converter (ADC); CMOS; Positron emission tomography (PET); Time of flight (TOF); Time to digital converter (TDC)

Indexed keywords

TIME OF FLIGHT (TOF); TIME TO DIGITAL CONVERTERS (TDC);

CALIBRATION; CMOS INTEGRATED CIRCUITS; IMAGE RESOLUTION; IMAGING SYSTEMS; POSITRON EMISSION TOMOGRAPHY;

ANALOG TO DIGITAL CONVERSION;

EID: 35348963166     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.903183     Document Type: Article

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